Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Atomic Electron Tomography: Past, Present and Future

Higher-order Structure of Human Chromosomes Observed by Electron Tomography and Electron Diffraction

Optimization of EDX Tomography Acquisition Geometry for Electronic Device Characterization

Artificial Intelligence Enabled Information Inpainting and Artifact Removal for Electron Tomography

Approaching Operando Imaging of Functional Materials

Solid State Dynamics Visualized by Environmental EM

The Effect of Orientation on Cu2O Reduction Under Methanol Observed by in Situ ETEM

Reduction and Carburization of Iron Oxides for Fischer-Tropsch Synthesis

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Development and Application of Ultrafast Transmission Electron Microscope Based on Schottky Field Emission

Relativistic Ultrafast Electron Diffraction of Nanomaterials

Coherent Phase Control of Ultrashort Electron Pulses by Traveling Optical Waves and Whispering-gallery Modes

DIY: Microscopy-Inspired Mkrspace 3D Printing

Sculpting Science: Inspired Artwork from the Microscopic World

Applications of 3D Printing in Microscopy Research

3D Printed Microscope Optomechanical Tools

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Learning Biology Through Puzzle-solving: Unbiased Automatic Understanding of Microscopy Images with Self-supervised Learning

AI-based Brain Image Segmentation Using Synthesized Data

Deep Learning-based Automated Measurement Method for Cross-sectional SEM Images in Semiconductor Devices

Robust Deep-learning Based Autofocus Score Prediction for Scanning Electron Microscope

Quantitative Prediction of Properties of Organic Molecules from ELNES via Artificial Neural Network

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Finding Meaning in 4D STEM: Strategies for Extracting Targeted Specimen Information

Recording 4D-STEM Datasets at a Range of Beam Tilts Simultaneously with Multi-Beam Electron Diffraction

Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

DIY: Microscopy-Inspired Mkrspace 3D Printing

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures