Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Connecting Structural Heterogeneity to Properties of Disordered Materials

Quantitative Analysis of Correlated Atomic Displacements via Diffuse Electron Scattering

Towards Automated Classification of Complex 4D-STEM Datasets

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Overcoming Practical Limitations to Probe Electronic Structure in Novel Quantum Materials

EELS Analysis of Ce Valence State of SiO2 Supported CeO2 Nanoparticles, CeOx Nanoclusters and Ce Single Atoms

Direct Correlation of Grain Boundary Defect Chemistry with Anion Conductivity in Oxide Ceramics Using Direct Detection Electron Energy-Loss Spectroscopy

Exploiting Electron Beam Interactions with Ultralow Energy Excitations for Nanoscale Analysis of Complex Optical and Biological Systems

Atomic-scale Identification of High-temperature Superconductivity at La2CuO4 Interfaces

Crystallography at the Nanoscale and MicroED with Electrons and X-rays

Electron Diffraction as a Tool for Hydrogen Atom Localization and Absolute Structure Determination of Nanocrystals Containing Organic Molecules

Identification of Structure and Chemical Occupancy of Emerging Complex Compounds via Analytical Electron Microscopy

Determining Atomic Structures from Digitally Defined Regions of Nanocrystals

3D Electron Diffraction for Structure Analysis of Challenging Inorganic Materials

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

K-ratio Measurements by WDS and EDS for Instrument Maintenance, Calibration, and Accurate Quantification

Zinc Sulphide Ore Formation – a Cathodoluminescence and X-ray Examination

Quantitative EPMA Compositional Mapping and Cluster Analysis Applied to Meteorites

Development of SEM Equipped with Superconductor X-ray Detector Toward Chemical State Nanoimaging for CFRP/adhesive Boundary

Reasons to Replace a Proportional Counter (PC) in the Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD)

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Correlation of Spectroscopic Methods with Microanalysis

Microscopy-based Multi-technique, Multi-scale Characterization of Polymer Electrolyte Membrane Devices

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy II - Detection and Subtlety

Nanomaterials in Operando Conditions

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Featured Multitechnique Methods and Beamline Analysis

Applications of Full-field Transmission X-ray Nanotomography and X-ray Nanospectroscopy at Stanford Synchrotron Radiation Lightsource

Microscopy and Microanalysis

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Volume 26 - December 2020

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Crystallography at the Nanoscale and MicroED with Electrons and X-rays

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Correlation of Spectroscopic Methods with Microanalysis

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy II - Detection and Subtlety

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Featured Multitechnique Methods and Beamline Analysis