Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-05-13T19:16:14.006Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of SEM Equipped with Superconductor X-ray Detector Toward Chemical State Nanoimaging for CFRP/adhesive Boundary

Published online by Cambridge University Press:  30 July 2020

Go Fujii ,
Wenqin Peng ,
Masahiro Ukibe ,
Shigetomo Shiki ,
Naoko Yamazaki ,
Koichi Hasegawa ,
Kiyoka Takagi  and
Masataka Ohkubo
Go Fujii
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Wenqin Peng
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Masahiro Ukibe
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Shigetomo Shiki
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Naoko Yamazaki
Affiliation:
Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan
Koichi Hasegawa
Affiliation:
Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan
Kiyoka Takagi
Affiliation:
Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan
Masataka Ohkubo
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 764 - 766
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Schlosser, D.M., Lechner, P., Lutz, G., Niculae, A., Soltaua, H., Struder, L., Eckhardt, R., Hermenaua, K., Schaller, G., Schopper, F., Jaritschin, O., Liebel, A., Simsek, A., Fiorini, C., and Longoni, A., Nucl. Inst. Methods in Phys. 624 (2010) 270.10.1016/j.nima.2010.04.038CrossRefGoogle Scholar
Takahashi, H., Murano, T., Takakura, M., Asahina, S., Terauchi, M., Koike, M., Imazono, T.. Koeda, M., and Nagano, T., IOP Conference Series: Materials Science and Engineering, 109 (2019) 012017.10.1088/1757-899X/109/1/012017CrossRefGoogle Scholar
Terauchi, M. and Sato, Y., Microscopy and Microanalysis 25 (2019) 1754.10.1017/S1431927619009504CrossRefGoogle Scholar
Ukibe, M., Fujii, G., Shiki, S., Kitajima, Y., and Ohkubo, M., Low, J.. Temp. Phys. 184 (2016) 200.10.1007/s10909-016-1488-xCrossRefGoogle Scholar
Fujii, G., Ukibe, M., Shiki, S., and Ohkubo, M., SIP-IMASM 2018 abstract booklet (2018) 23.Google Scholar
Fujii, G., Ukibe, M., Shiki, S., and Ohkubo, M., X-ray spectrometry 46 (2017) 325.10.1002/xrs.2796CrossRefGoogle Scholar
Fujii, G., Ukibe, M., Shiki, S., and Ohkubo, M., Microscopy and Microanalysis 25 (2019) 262.Google Scholar