Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Microanalysis

Abstract

Effect of Ultrasonic Shot Peening on Microstructural Evolution of Duplex Stainless Steel S32750

Synthesis and Characterization of HfC/SiC Ceramic Nanoparticles

Effect on Microstructure and Nanoindentation of a AlCoFeMoNi High Entropy Alloy.

Synthesis and Characterization of Tio2/C Composite for Photocatalytic Degradation of Dyes.

Vendor Symposium

Abstract

S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering

Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling

Influence of SEM Deposited Protection Layers on FIB Induced Amorphous Damage of TEM Lamella Prepared by ExSolve WTP

A Versatile All-in-One Automated Processor for Electron Microscopy

Cryo-EM Workflow Optimization

Tilt-free EBSD

The Benefits and Applications of a CMOS-based EBSD Detector

Introducing Lumis - A Novel EBSD Detector

Optimizing the Nion STEM for In-Situ Experiments

Sub-Å STEM Resolution From 30-300kV

Latest Developments in Environmental SEM Systems

Aquiring High-Quality Microscopic Images Through Silicon Without Damaging the Finished Product

Laser Scanning Confocal Microscopy 3D Surface Metrology Applications

Chromatic Line Confocal Sensor Technology in High-Speed 3D and Deep Depth of Focus 2D Imaging Applications

Insights on Sample Topography in EDX Spectroscopy with Annular SDD Detectors

An Evaluation of Beam-Damage Zone in Si Wafer Machined by Gatan MicroPREPTM Laser-Ablation

Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Microanalysis

Abstract

Vendor Symposium

Abstract