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Optimizing the Nion STEM for In-Situ Experiments

Published online by Cambridge University Press:  01 August 2018

Michael T. Hotz ,
George Corbin ,
Niklas Dellby ,
Tracy C. Lovejoy ,
Gwyn S. Skone ,
Jean-Denis Blazit ,
Mathieu Kociak ,
Odile Stephan ,
Marcel Tence  and
H.W. Zandbergen
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Michael T. Hotz
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
George Corbin
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Niklas Dellby
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Tracy C. Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Gwyn S. Skone
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Jean-Denis Blazit
Affiliation:
Laboratoire de Physique des Solides, CNRS, Universite Paris Sud, 91405 Orsay, France
Mathieu Kociak
Affiliation:
Laboratoire de Physique des Solides, CNRS, Universite Paris Sud, 91405 Orsay, France
Odile Stephan
Affiliation:
Laboratoire de Physique des Solides, CNRS, Universite Paris Sud, 91405 Orsay, France
Marcel Tence
Affiliation:
Laboratoire de Physique des Solides, CNRS, Universite Paris Sud, 91405 Orsay, France
H.W. Zandbergen
Affiliation:
Department of NanoScience, Delft University of Technology, 2628 CJ Delft, The Netherlands
Ondrej L. Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA Department of Physics, Arizona State University, Tempe, AZ 85287, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1132 - 1133
Copyright
© Microscopy Society of America 2018 

References

[1] Lovejoy, T.C., et al these proceedings.Google Scholar
[2] Kociak, M. Zagonel, L.F. Ultramicroscopy 176 2017 112–Google Scholar
[3] Krivanek, O.L., et al these proceedings.Google Scholar
[4] Hotz, M.T., et al, Microsc. Microanal. 23(Suppl 1 2017) p. 54–55.Google Scholar
[5] This work has received support from the French National Agency for Research under the program of future investment TEMPOS- CHROMATEM, reference No. ANR-10- EQPX- 50.Google Scholar