Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Microanalysis

Abstract

TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

Understanding Conditions Affecting Background in Atom Probe Tomography with Implications for Analysis of Hydrogen

Auger Electron Spectroscopy - History and Applications in Materials Characterization with Emphasis on Medical Devices

Spherical Particles in Al65Cu20Fe15 Alloy Prepared by Arc Melting

Recent Developments in XPS - Microspectroscopy, Spectromicroscopy, Lateral and Depth Information towards Cutting-Edge Solid Electrolytes and Biomaterials

Observation of Lithium fluorescence X-ray utilizing Superconducting-Tunnel-Junction Array X-ray detector toward in situ mapping analyses of precipitated metal lithium in sold electrolytes of Li-ion batteries

Multidimensional Imaging of Surfaces with Ringing Mode of Atomic Force Microscopy

Nanoscale Hyperspectral Characterization of Source Rock in Unconventional Reservoirs using Photo-Induced Force Microscopy

Multimodal Chemical and Functional Imaging of Nanoscale Transformations Away from Equilibrium

Nanoelectrochemistry and Nanoelectrics at Electrode/Electrolyte Interface

Utilizing Correlative, Multi-Technique Surface Analysis to Complement Microscopy Studies

Continuous Wavelet Transforms for Measuring Roughness of Nanoscale Interfaces

Surface Analysis of Fine Art Paintings: Studying Degradation Mechanisms with a Systematic Approach

Microstructural and Material Properties of Individual Zirconium Hydride Domains Formed Under Simulated Conditions

Correlative Defect Characterization in Semiconductors via Electron Channeling Contrast Imaging and Scanning Deep Level Transient Spectroscopy

Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF

In-situ Low Energy Argon Ion Source for the Improvement of EBSD Pattern Acquisition

Characterization of Si Surface by SEM-SXES using Low Incident Voltage

The Powder-pack Boriding Process: A Microstructure Comparison of Boride Layers Formed on AISI 4150 and M2 Steels

Additive Manufacturing Methods for Soft Magnetic Composites (SMCs)

Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Microanalysis

Abstract