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TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

Published online by Cambridge University Press:  01 August 2018

Felix Kollmer ,
Nathan Havercroft ,
Anja Henss ,
Henrik Arlinghaus ,
Wolfgang Paul ,
Rudolf Moellers  and
Ewald Niehuis
Felix Kollmer
Affiliation:
IONTOF GmbH, Muenster, Germany
Nathan Havercroft
Affiliation:
ION-TOF USA, Inc., Chestnut Ridge, NY, USA
Anja Henss
Affiliation:
Physikalisch-Chemisches Institut, Justus-Liebig University Giessen, Germany
Henrik Arlinghaus
Affiliation:
IONTOF GmbH, Muenster, Germany
Wolfgang Paul
Affiliation:
IONTOF GmbH, Muenster, Germany
Rudolf Moellers
Affiliation:
IONTOF GmbH, Muenster, Germany
Ewald Niehuis
Affiliation:
IONTOF GmbH, Muenster, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1026 - 1027
Copyright
© Microscopy Society of America 2018 

References

[1] Vanbellingen, Quentin P., et al, Rapid Commun. Mass Spectrom. 29 2015) p. 1187. doi: DOI: 10.1002/rcm.7210.Google Scholar
[2] Worrich, Anja, et al, Nat. Commun. 8 2017) p. 15472. doi: DOI: 10.1038/NCOMMS1547.Google Scholar