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Insights on Sample Topography in EDX Spectroscopy with Annular SDD Detectors

Published online by Cambridge University Press:  01 August 2018

A. Schoning ,
R. Lackner ,
A. Bechteler ,
A. Liebel ,
J.M. Davis ,
A. Niculae  and
H. Soltau
A. Schoning
Affiliation:
PNDetector GmbH, Munchen, Germany
R. Lackner
Affiliation:
PNDetector GmbH, Munchen, Germany
A. Bechteler
Affiliation:
PNDetector GmbH, Munchen, Germany
A. Liebel
Affiliation:
PNDetector GmbH, Munchen, Germany
J.M. Davis
Affiliation:
PNDetector GmbH, Munchen, Germany
A. Niculae
Affiliation:
PNDetector GmbH, Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Munchen, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1144 - 1145
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Niculae, A, et al, Microscopy & Microanalysis 18(S2 2012) p. 1202.Google Scholar