Microscopy and Microanalysis: Volume 18 -

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Volume 18 - October 2012

Contents

Page 38 of 63

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-01

Research Article

Recent advances in Scanning Transmission X-ray Microscopy
A. Hitchcock, V. Berejnov, S. Kalirai, M. Obst, T. Tyliszczak
Published online by Cambridge University Press:

23 November 2012, pp. 966-967
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Simple, Model Based Approach for Robust Quantification of EELS Spectra and Spectrum-Images
P.J. Thomas, R.D. Twesten
Published online by Cambridge University Press:

23 November 2012, pp. 968-969
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

New Approaches to Data Processing for Atomic Resolution EELS
P. Cueva, R. Hovden, J.A. Mundy, H.L. Xin, D.A. Muller
Published online by Cambridge University Press:

23 November 2012, pp. 970-971
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

EDX and EELS Chemical Analysis with a Probe Corrected STEM
G. Kothleitner
Published online by Cambridge University Press:

23 November 2012, pp. 972-973
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-02

Research Article

Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector
M. Watanabe, A. Yasuhara, E. Okunishi
Published online by Cambridge University Press:

23 November 2012, pp. 974-975
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy
T.C. Lovejoy, G.J. Corbin, N. Dellby, Z.S. Szilagyi, O.L. Krivanek, M. Falke, A. Kaeppel, W. Hahn, M. Rohde, Q. Ramasse, I. Godfrey, D.M. Kepaptsoglou, M.C. Sarahan, M.D. Shannon, A.L. Bleloch, R.J. Keyse, R. Zan
Published online by Cambridge University Press:

23 November 2012, pp. 976-977
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Challenges of Quantification with Large Solid Angle SDDs in the AEM
P.G. Kotula, J.R. Michael
Published online by Cambridge University Press:

23 November 2012, pp. 978-979
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Analysis of Small Metal Particles
S.A. Bradley
Published online by Cambridge University Press:

23 November 2012, pp. 980-981
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative EDS Analysis of Nanometer-Scale Core/Shell Pd/Rh Structures
J.D. Sugar, P.J. Cappillino, D.B. Robinson, P.G. Kotula
Published online by Cambridge University Press:

23 November 2012, pp. 982-983
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-03

Research Article

Quantification by SIMS at the nanoscale : NanoSIMS50 latest developments
J. Audinot, N. Valle, H. Migeon
Published online by Cambridge University Press:

23 November 2012, pp. 984-985
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Understanding Best Practices for Atom Probe Tomography Implant Analysis
T.J. Prosa, D.J. Larson, D. Olson, D. Lawrence, K. Henry, E. Steel, I. Anderson
Published online by Cambridge University Press:

23 November 2012, pp. 986-987
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Evaluating and Improving the Accuracy of Atom Probe Reconstructions via Correlative TEM Tomography
K.T. Henry, A.A. Herzing, E.B. Steel, I.M. Anderson
Published online by Cambridge University Press:

23 November 2012, pp. 988-989
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Detection of individual atoms with energy dispersive x-ray spectroscopy in scanning transmission electron microscopy
D.O. Klenov
Published online by Cambridge University Press:

23 November 2012, pp. 990-991
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-04

Research Article

Simulating STEM images in micrometers-thick solid and liquid specimens
D. Drouin, H. Demers, N. de Jonge
Published online by Cambridge University Press:

23 November 2012, pp. 992-993
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Evaluation of Monte Carlo Codes with Experimental k-Ratio of Binary Specimen for Quantitative Microanalysis
P.T. Pinard, S. Richter, H. Demers, R. Gauvin
Published online by Cambridge University Press:

23 November 2012, pp. 994-995
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Applications of the Scanning Low Energy Electron Microscope
I. Mullerova, E. Mikmekova, S. Mikmekova, M. Hovorka, L. Frank
Published online by Cambridge University Press:

23 November 2012, pp. 996-997
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Detectability Limits in EELS by Monte Carlo Simulations
M. Attarian Shandiz, R. Gauvin, F. Salvat
Published online by Cambridge University Press:

23 November 2012, pp. 998-999
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A New Method to Validate Ionization Cross-Sections for the computation of Cliff-Lorimer K_(A-B) Factors.
R. Gauvin
Published online by Cambridge University Press:

23 November 2012, pp. 1000-1001
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-05

Research Article

Radiation damage in quartz from uranium-bearing sandstones
C.M. MacRae, N.C. Wilson, A. Torpy, M.I. Pownceby
Published online by Cambridge University Press:

23 November 2012, pp. 1002-1003
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

How To Do Really Bad SEM/EDS Quantitative Analysis, and Never Even Notice!
D.E. Newbury, N.W. Ritchie
Published online by Cambridge University Press:

23 November 2012, pp. 1004-1005
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Page 38 of 63

Microscopy and Microanalysis

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Volume 18 - October 2012

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-01

Research Article

Recent advances in Scanning Transmission X-ray Microscopy

A Simple, Model Based Approach for Robust Quantification of EELS Spectra and Spectrum-Images

New Approaches to Data Processing for Atomic Resolution EELS

EDX and EELS Chemical Analysis with a Probe Corrected STEM

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-02

Research Article

Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy

Challenges of Quantification with Large Solid Angle SDDs in the AEM

Analysis of Small Metal Particles

Quantitative EDS Analysis of Nanometer-Scale Core/Shell Pd/Rh Structures

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-03

Research Article

Quantification by SIMS at the nanoscale : NanoSIMS50 latest developments

Understanding Best Practices for Atom Probe Tomography Implant Analysis

Evaluating and Improving the Accuracy of Atom Probe Reconstructions via Correlative TEM Tomography

Detection of individual atoms with energy dispersive x-ray spectroscopy in scanning transmission electron microscopy

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-04

Research Article

Simulating STEM images in micrometers-thick solid and liquid specimens

Evaluation of Monte Carlo Codes with Experimental k-Ratio of Binary Specimen for Quantitative Microanalysis

Applications of the Scanning Low Energy Electron Microscope

Detectability Limits in EELS by Monte Carlo Simulations

A New Method to Validate Ionization Cross-Sections for the computation of Cliff-Lorimer K_(A-B) Factors.

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-05

Research Article

Radiation damage in quartz from uranium-bearing sandstones

How To Do Really Bad SEM/EDS Quantitative Analysis, and Never Even Notice!

Microscopy and Microanalysis

Refine listing

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Volume 18 - October 2012

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-01

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-02

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-03

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-04

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-05

Research Article