Microscopy and Microanalysis: Volume 18 -

Chemical and structural characterization with soft X-ray spectro-microscopies in correlation with electron and atomic force microscopies
A. Hitchcock, B. Leung, J. Brash, E. Najafi, D. Rossouw, G. Botton
Published online by Cambridge University Press:

23 November 2012, pp. 846-847
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Physical, Chemical and Hygroscopic Properties of Submicrometer Particles Studied using X-ray Spectro-Microscopy and Atomic Force Microscopy
A.V. Tivanski
Published online by Cambridge University Press:

23 November 2012, pp. 848-849
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Assessing Defect Uniformity in High Temperature Superconducting Wires
T.G. Holesinger
Published online by Cambridge University Press:

23 November 2012, pp. 850-851
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

TEM Analysis Of Block Copolymer Thin Films By Energy-Filtered Chemical Mapping And Electron Tomography
F.I. Allen, P. Ercius, A.M. Minor, N.P. Balsara
Published online by Cambridge University Press:

23 November 2012, pp. 852-853
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

On-line correlative imaging by using electron-photon hybrid microscope
H. Minoda, K. Takahashi, T. Onuma, H. Iijima, K. Nagayama, Y. Arai, S. Tarakawa
Published online by Cambridge University Press:

23 November 2012, pp. 854-855
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A hybrid imaging method to enhance image contrast
S. Wang
Published online by Cambridge University Press:

23 November 2012, pp. 856-857
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Optimization of Biological Samples for Scanning Transmission X-ray Microscopy and Infrared Environmental Imaging
A. Dohnalkova, M.J. Marshall, E. Hill, C. Szymanski, A.L. Kilcoyne, C. Hirschmugl
Published online by Cambridge University Press:

23 November 2012, pp. 858-859
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Diffusion Couple Approach for Exploring Refractory Metals Additions to Structural Steels
L.N. Brewer, A.L. McGinnis, S.K. Menon, K. Hattar, J.D. Puskar, S.H. Goods
Published online by Cambridge University Press:

23 November 2012, pp. 860-861
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

AFM Transverse Shear as a Probe of Crystallinity at the Interface of Gate Insulator and Organic Semiconductor
G. Haugstad
Published online by Cambridge University Press:

23 November 2012, pp. 862-863
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High Speed AFM as a Complimentary Technique to Electron Microscopy in Nanomaterial Research
C. Su
Published online by Cambridge University Press:

23 November 2012, pp. 864-865
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Combined AFM Nanoindentation and Finite Element Analysis of Soft Heterogeneous Biomaterials
B.L. Doss, J.R. Staunton, M. Dannemeyer, M. Linhart, R. Ros
Published online by Cambridge University Press:

23 November 2012, pp. 866-867
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Nanoscale Chemical Composition Mapping with AFM-based Infrared Spectroscopy
C. Prater, M. Lo, Q. Hu, K. Kjoller, C. Marcott, A. Dazzi, B. Chase
Published online by Cambridge University Press:

23 November 2012, pp. 868-869
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Custom-Designed Electrical Potential Scanning Microscopy for Laboratory Applications: Image Contrast Calibration and Tests
A.E. Kamanyi, A. Abdelrahman, W. Grill
Published online by Cambridge University Press:

23 November 2012, pp. 870-871
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Direct STM Observation of the Organometallic Intermediates in Ullmann Coupling Reactions on Metal Surfaces
K. Wu
Published online by Cambridge University Press:

23 November 2012, pp. 872-873
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Application Of Surface Analytical Techniques For Understanding Deposit Formation On Magnetic Tape Recording Head Surfaces
F.E. Spada, D.F. Paul, J.S. Hammond
Published online by Cambridge University Press:

23 November 2012, pp. 874-875
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

On averaging force curves over heterogeneous surfaces in atomic force microscopy
V. Kalaparthi, I. Sokolov, M. Kreshchuk, M.E. Dokukin
Published online by Cambridge University Press:

23 November 2012, pp. 876-877
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Optimization of Experiment in Traditional and Multi-Frequency Atomic Force Microscopy
S. Magonov, J. Alexander, S. Belikov, C. Wall
Published online by Cambridge University Press:

23 November 2012, pp. 878-879
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

AFM to Study Charging of Individual Quantum Dots with Light
N. Guz, M. Dokukin, I. Sokolov
Published online by Cambridge University Press:

23 November 2012, pp. 880-881
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution
O. Schulz, A. Ward, R. Ros, Z. Zhao , Y. Liu, H. Yan
Published online by Cambridge University Press:

23 November 2012, pp. 882-883
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atomic force microscopy and Kelvin probe force microscopy to study the mechanism of amyloid fibril formation and toxicity.
E. Drolle, F. Hane, Y. Choi, R. Gaikwad, S. Attwood, Z. Leonenko
Published online by Cambridge University Press:

23 November 2012, pp. 884-885
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Volume 18 - October 2012

Instrumentation Symposium

Correlative Microscopy and Chemical Imaging-02

Research Article

Chemical and structural characterization with soft X-ray spectro-microscopies in correlation with electron and atomic force microscopies

Physical, Chemical and Hygroscopic Properties of Submicrometer Particles Studied using X-ray Spectro-Microscopy and Atomic Force Microscopy

Correlative Microscopy and Chemical Imaging-03

Research Article

Assessing Defect Uniformity in High Temperature Superconducting Wires

TEM Analysis Of Block Copolymer Thin Films By Energy-Filtered Chemical Mapping And Electron Tomography

On-line correlative imaging by using electron-photon hybrid microscope

A hybrid imaging method to enhance image contrast

Optimization of Biological Samples for Scanning Transmission X-ray Microscopy and Infrared Environmental Imaging

Diffusion Couple Approach for Exploring Refractory Metals Additions to Structural Steels

Surface and Subsurface Analysis-01

Research Article

AFM Transverse Shear as a Probe of Crystallinity at the Interface of Gate Insulator and Organic Semiconductor

High Speed AFM as a Complimentary Technique to Electron Microscopy in Nanomaterial Research

Combined AFM Nanoindentation and Finite Element Analysis of Soft Heterogeneous Biomaterials

Nanoscale Chemical Composition Mapping with AFM-based Infrared Spectroscopy

Surface and Subsurface Analysis-02

Research Article

Custom-Designed Electrical Potential Scanning Microscopy for Laboratory Applications: Image Contrast Calibration and Tests

Direct STM Observation of the Organometallic Intermediates in Ullmann Coupling Reactions on Metal Surfaces

Application Of Surface Analytical Techniques For Understanding Deposit Formation On Magnetic Tape Recording Head Surfaces

On averaging force curves over heterogeneous surfaces in atomic force microscopy

Surface and Subsurface Analysis-03

Research Article

Optimization of Experiment in Traditional and Multi-Frequency Atomic Force Microscopy

AFM to Study Charging of Individual Quantum Dots with Light

Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution

Atomic force microscopy and Kelvin probe force microscopy to study the mechanism of amyloid fibril formation and toxicity.

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Instrumentation Symposium

Correlative Microscopy and Chemical Imaging-02

Research Article

Correlative Microscopy and Chemical Imaging-03

Research Article

Surface and Subsurface Analysis-01

Research Article

Surface and Subsurface Analysis-02

Research Article

Surface and Subsurface Analysis-03

Research Article