Microscopy and Microanalysis: Volume 18 -

Nano-scale Fracture Test for Local Interface Adhesion Strength Evaluation in LSI Interconnects
N. Shishido, H. Sugiyama, S. Kamiya, M. Omiya, T. Nagasawa, T. Nokuo, T. Suzuki, T. Nakamura
Published online by Cambridge University Press:

23 November 2012, pp. 766-767
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Size and Shape Effects on the Mechanical Deformation of 1-nm-wide Gold Nanorods
M.J. Lagos, F. Sato, G. Douglas, D. Ugarte
Published online by Cambridge University Press:

23 November 2012, pp. 768-769
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-situ TEM compression testing of Ti-7wt%Al nanopillars
E. Tochigi, A.M. Minor, M. Brandes, M.J. Mills
Published online by Cambridge University Press:

23 November 2012, pp. 770-771
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

HR-STEM In-Situ Mechanical Testing of FIB Samples
M.L. Trudeau, V. René, R. Lisa
Published online by Cambridge University Press:

23 November 2012, pp. 772-773
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Analysis of Thermomechanical Processing of AA5083 for Corrosion Resistance
J.C. Hsieh, D. Scotto D'Antuono, C.M. Barr, W. Golumbfski, M.L. Taheri, J. Gaies
Published online by Cambridge University Press:

23 November 2012, pp. 774-775
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA
T. Murano, H. Takahashi, N. Handa, M. Terauchi, M. Koike, T. Kawachi, I. Takashi, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto
Published online by Cambridge University Press:

23 November 2012, pp. 776-777
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Modification of the Kevlar-29 fibers tensile properties after a brine (NaCl) treatment
A. Tejeda-Ochoa, W. Antunez-Flores, R. Martinez-Sanchez, J.M. Herrera-Ramirez
Published online by Cambridge University Press:

23 November 2012, pp. 778-779
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In situ SEM Study of Microbeam Bending of Diffusion Aluminide Bond Coats
S. Bhowmick, S. Asif, O.L. Warren, N. Jaya B, V. Jayaram, S.K. Biswas
Published online by Cambridge University Press:

23 November 2012, pp. 780-781
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microstructural and Mechanical Properties of a 304 Stainless Steel Fiber
W. Antúnez-Flores, R. Torres-Sánchez, J.M. Herrera-Ramírez, K.A. Garcia-Aguirre, J.A. Garcia-Estrada
Published online by Cambridge University Press:

23 November 2012, pp. 782-783
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

The Tensile Behavior of E-glass fibers
E.J. Parra-Venegas, K. Campos-Venegas, R. Martinez-Sanchez, J.M. Herrera-Ramirez, A. Rodriguez-Miranda
Published online by Cambridge University Press:

23 November 2012, pp. 784-785
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Oxide-metal interfaces strength measurements on passive films formed in heavy liquid
M. Rebelo de Figueiredo, P. Hosemann, K. Kikuchi
Published online by Cambridge University Press:

23 November 2012, pp. 786-787
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Structural and Mechanical Characterization of Hi-Nicalon Fibers
I. Lujan-Regalado, J.A. Bencomo-Cisneros, K. Campos-Venegas, R. Martinez-Sanchez, J.M. Herrera-Ramirez, J.D. Figueroa-Duarte, J. Gonzalez-Cantu
Published online by Cambridge University Press:

23 November 2012, pp. 788-789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In Situ Electrical and Mechanical Characterization of individual Nickel Nanowires utilizing Dural Beam Focused Ion Beam and Nanomanipulator Systems
S. Xu, M. Jin, N. Yao
Published online by Cambridge University Press:

23 November 2012, pp. 790-791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-Situ SEM Characterization of Fracture Behavior
A. Lupinacci, P. Hosemann, A. Minor, A. Shapiro
Published online by Cambridge University Press:

23 November 2012, pp. 792-793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Helium ions for nano-engineering
E. van Veldhoven, D. Maas
Published online by Cambridge University Press:

23 November 2012, pp. 794-795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

characterization of graphene and BN nano sheets by helium ion microscopy
H. Guo, J. Gao, D. Fujita
Published online by Cambridge University Press:

23 November 2012, pp. 796-797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Modeling for Multi-Beam Microscopy
D.C. Joy, R. Ramachandra, D. Joy, B. Griffin
Published online by Cambridge University Press:

23 November 2012, pp. 798-799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Nanopatterning with the Helium Ion Microscope
D.S. Pickard, V. Viswanathan, C. Fang, Z. Ai, H. Hao, Y. Wang, M. Bosman, J. Dorfmüller, H. Giessen
Published online by Cambridge University Press:

23 November 2012, pp. 800-801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Widening the Window of Particle Beam Technology: Helium Ion Microscopy
M. Postek, A.E. Vladar, B. Ming, K. Purushotham
Published online by Cambridge University Press:

23 November 2012, pp. 802-803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High angular intensity gas field ion source with single atom tip
H. Moritani, S. Matsubara, T. Hashizume
Published online by Cambridge University Press:

23 November 2012, pp. 804-805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Volume 18 - October 2012

Instrumentation Symposium

Measurement and Visualization of Mechanical Behavior at Micro and Nano-scales-06

Research Article

Nano-scale Fracture Test for Local Interface Adhesion Strength Evaluation in LSI Interconnects

Size and Shape Effects on the Mechanical Deformation of 1-nm-wide Gold Nanorods

In-situ TEM compression testing of Ti-7wt%Al nanopillars

Measurement and Visualization of Mechanical Behavior at Micro and Nano-scales-07

Research Article

HR-STEM In-Situ Mechanical Testing of FIB Samples

Analysis of Thermomechanical Processing of AA5083 for Corrosion Resistance

High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA

Modification of the Kevlar-29 fibers tensile properties after a brine (NaCl) treatment

In situ SEM Study of Microbeam Bending of Diffusion Aluminide Bond Coats

Microstructural and Mechanical Properties of a 304 Stainless Steel Fiber

The Tensile Behavior of E-glass fibers

Oxide-metal interfaces strength measurements on passive films formed in heavy liquid

Structural and Mechanical Characterization of Hi-Nicalon Fibers

In Situ Electrical and Mechanical Characterization of individual Nickel Nanowires utilizing Dural Beam Focused Ion Beam and Nanomanipulator Systems

In-Situ SEM Characterization of Fracture Behavior

Helium Ion Microscopy-01

Research Article

Helium ions for nano-engineering

characterization of graphene and BN nano sheets by helium ion microscopy

Modeling for Multi-Beam Microscopy

Nanopatterning with the Helium Ion Microscope

Helium Ion Microscopy-02

Research Article

Widening the Window of Particle Beam Technology: Helium Ion Microscopy

High angular intensity gas field ion source with single atom tip

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Instrumentation Symposium

Measurement and Visualization of Mechanical Behavior at Micro and Nano-scales-06

Research Article

Measurement and Visualization of Mechanical Behavior at Micro and Nano-scales-07

Research Article

Helium Ion Microscopy-01

Research Article

Helium Ion Microscopy-02

Research Article