Microscopy and Microanalysis: Volume 18 -

The Role of Electron Microscopy and Focused Ion Beam in Studying Friction Modifiers in Engine Oils
A. Avishai, A.H. Heuer, D. Jayne
Published online by Cambridge University Press:

23 November 2012, pp. 646-647
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Cryo-FIB of GaSb and InSb and Temperature Control Effects on Milling
C. Santeufemio
Published online by Cambridge University Press:

23 November 2012, pp. 648-649
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

FIB TEM sample preparation without using lift out tools
S. Xu, N. Yao
Published online by Cambridge University Press:

23 November 2012, pp. 650-651
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Combined plasma FIB-SEM
J. Jiruse, T. Hrncir, F. Lopour, M. Zadrazil, A. Delobe, O. Salord
Published online by Cambridge University Press:

23 November 2012, pp. 652-653
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Reliable Solution for ultra-thin HRTEM Lamella Fabrication by means of BSE Thickness Mapping in Combination with the novel “X2” Preparation Method
R. Salzer, L. Lechner
Published online by Cambridge University Press:

23 November 2012, pp. 654-655
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Cryo FIB preparation of viscous samples for cryo-TEM
M.R. Kupsta
Published online by Cambridge University Press:

23 November 2012, pp. 656-657
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atom Probe and TEM Investigation of Natural Olivines
B.W. Arey, D. Perera, L. Kovarik, O. Qafoku, A. Felmy, B. Gorman
Published online by Cambridge University Press:

23 November 2012, pp. 658-659
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

EnzMet™: An Enzymatic Metallography Reagent for Accurately Delineating Neuronal Boundaries for Segmenting Gap Junction-Coupled Neurons in their Three-dimensional Space
I.I. Torres-Vazquez, J.L. Serrano-Velez, E. Rosa-Molinar, F. Orange, M.J. Guinel, I. Koutis, J. Wolf, C. Laimer, V. Joshi, R.D. Powell
Published online by Cambridge University Press:

23 November 2012, pp. 660-661
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Advances in Fluorescence Super-Resolution Biplane FPALM and STED Microscopy
J. Bewersdorf
Published online by Cambridge University Press:

23 November 2012, pp. 662-663
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Extending Subdiffractive Fluorescence Microscopy to Thicker Samples
A. York, H. Shroff
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23 November 2012, pp. 664-665
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Using Molecular Position and Dynamics to Understand Higher Order Biological Function
C. Galbraith, J. Galbraith
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23 November 2012, pp. 666-667
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Facile Syntheses of Photoactivatable Rhodamines for Super-Resolution Microscopy
L.D. Lavis, J.B. Grimm, L.M. Wysocki, A.N. Tkachuk, T.A. Brown, E. Betzig
Published online by Cambridge University Press:

23 November 2012, pp. 668-669
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Fast Single Molecule Position Determination using Graphics Processing Units
K. Lidke
Published online by Cambridge University Press:

23 November 2012, pp. 670-671
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Super-resolution microscopy reveals mechanistic details of bacterial cell division
P. Eswara Moorthy, K.S. Ramamurthi, M.L. Erb, J.A. Gregory, K. Pogliano, J. Pogliano, J. Silverman
Published online by Cambridge University Press:

23 November 2012, pp. 672-673
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Examining Mitochondrial Nucleoid Structure and Organization by Correlative Super-Resolution Fluorescence and Electron Microscopy
B.G. Kopek, G. Shtengel, C. Xu, T. Brown, A. Tkachuk, D. Clayton, H. Hess
Published online by Cambridge University Press:

23 November 2012, pp. 674-675
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Low angle ADF STEM defect imaging
P. Phillips, M. De Graef, L. Kovarik, A. Agrawal, W. Windl, M. Mills
Published online by Cambridge University Press:

23 November 2012, pp. 676-677
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High Angular Resolution Electron Channeling X-ray/Electron Spectroscopy
N.J. Zaluzec
Published online by Cambridge University Press:

23 November 2012, pp. 678-679
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

What BSE Electrons can tell us. From ECCI via RBS to Low Loss BSE imaging
H. Jaksch
Published online by Cambridge University Press:

23 November 2012, pp. 680-681
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Electron Channeling Contrast Image (ECCI) Simulations
M. De Graef
Published online by Cambridge University Press:

23 November 2012, pp. 682-683
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
C. Trager-Cowan, G. Naresh-Kumar, B. Hourahine, P.R. Edwards, J. Bruckbauer, R.W. Martin, C. Mauder, A.P. Day, G. England, A. Winkelmann, P.J. Parbrook, A. Wilkinson
Published online by Cambridge University Press:

23 November 2012, pp. 684-685
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Volume 18 - October 2012

Instrumentation Symposium

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-05

Research Article

The Role of Electron Microscopy and Focused Ion Beam in Studying Friction Modifiers in Engine Oils

Cryo-FIB of GaSb and InSb and Temperature Control Effects on Milling

FIB TEM sample preparation without using lift out tools

Combined plasma FIB-SEM

Reliable Solution for ultra-thin HRTEM Lamella Fabrication by means of BSE Thickness Mapping in Combination with the novel “X2” Preparation Method

Cryo FIB preparation of viscous samples for cryo-TEM

Atom Probe and TEM Investigation of Natural Olivines

EnzMet™: An Enzymatic Metallography Reagent for Accurately Delineating Neuronal Boundaries for Segmenting Gap Junction-Coupled Neurons in their Three-dimensional Space

Super-resolution Microscopy – Principles and Practice-01

Research Article

Advances in Fluorescence Super-Resolution Biplane FPALM and STED Microscopy

Extending Subdiffractive Fluorescence Microscopy to Thicker Samples

Using Molecular Position and Dynamics to Understand Higher Order Biological Function

Super-resolution Microscopy – Principles and Practice-02

Research Article

Facile Syntheses of Photoactivatable Rhodamines for Super-Resolution Microscopy

Fast Single Molecule Position Determination using Graphics Processing Units

Super-resolution microscopy reveals mechanistic details of bacterial cell division

Examining Mitochondrial Nucleoid Structure and Organization by Correlative Super-Resolution Fluorescence and Electron Microscopy

Channeling Effects in Microscopy and Microanalysis-01

Research Article

Low angle ADF STEM defect imaging

High Angular Resolution Electron Channeling X-ray/Electron Spectroscopy

What BSE Electrons can tell us. From ECCI via RBS to Low Loss BSE imaging

Channeling Effects in Microscopy and Microanalysis-02

Research Article

Electron Channeling Contrast Image (ECCI) Simulations

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Instrumentation Symposium

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-05

Research Article

Super-resolution Microscopy – Principles and Practice-01

Research Article

Super-resolution Microscopy – Principles and Practice-02

Research Article

Channeling Effects in Microscopy and Microanalysis-01

Research Article

Channeling Effects in Microscopy and Microanalysis-02

Research Article