Microscopy and Microanalysis: Volume 18 -

Breaking the 1% Accuracy Barrier in EPMA
N.W. Ritchie, D.E. Newbury, S. Leigh
Published online by Cambridge University Press:

23 November 2012, pp. 1006-1007
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

EDS Spectrum Imaging with Fast Fourier Transforms
R. Gauvin, P. Michaud, H. Demers, M.L. Trudeau
Published online by Cambridge University Press:

23 November 2012, pp. 1008-1009
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Trace Analysis Is Worthless If the Peaks Are Misidentified!
D.E. Newbury, N.W. Ritchie
Published online by Cambridge University Press:

23 November 2012, pp. 1010-1011
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Accurate X-ray Mapping and Quantitative Analysis at Tilted Geometries
S. Burgess, P. Statham, J. Holland, C. Lang, S. Bhattiprolu
Published online by Cambridge University Press:

23 November 2012, pp. 1012-1013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Multivariate Statistical Analysis tool for the interpretation and the quantification of hyperspectral data: application to 3D EDX/FIB images
G. Lucas, P. Burdet, M. Cantoni, C. Hébert
Published online by Cambridge University Press:

23 November 2012, pp. 1014-1015
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Determination of EDS Detection Limits of Nanoparticle Using Monte Carlo Simulations
R. Gauvin, H. Demers, P. Michaud, N. Brodusch, M. Trudeau
Published online by Cambridge University Press:

23 November 2012, pp. 1016-1017
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Towards Quantitative X-ray Microanalysis using Manifold Learning
J.J. Scott
Published online by Cambridge University Press:

23 November 2012, pp. 1018-1019
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative EPMA using Bootstrap Methods
J. Davis, J. Scott
Published online by Cambridge University Press:

23 November 2012, pp. 1020-1021
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data
P. Michaud, R. Gauvin, H. Demers, N. Brodusch, M.J. Guinel
Published online by Cambridge University Press:

23 November 2012, pp. 1022-1023
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atomic resolution transmission imaging at 30keV via electron ptychography
J.M. Rodenburg, A. Maiden, M. Humphry, B. Kraus, M. Sarahan
Published online by Cambridge University Press:

23 November 2012, pp. 1024-1025
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative Confocal Sectioning in Double-Corrected STEM Utilizing Electron Energy Loss Spectroscopy and Post-Specimen Cc Correction
P. Ercius, H.L. Xin, H. Zheng, C. Dwyer
Published online by Cambridge University Press:

23 November 2012, pp. 1026-1027
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A method to avoid strain field induced artifacts in 2d chemical mapping of dilute GaNAs by HAADF STEM
T. Grieb, K. Müller, M. Schowalter, A. Rosenauer, R. Fritz, K. Volz, V. Grillo
Published online by Cambridge University Press:

23 November 2012, pp. 1028-1029
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Solving structure of the interfaces using atomic level energy dispersive x-ray spectroscopy
D.O. Klenov, A. Carlsson
Published online by Cambridge University Press:

23 November 2012, pp. 1030-1031
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Visualization of Hybridization States with Atomic Resolution Using STEM-EELS
M. Haruta, K. Kurashima, T. Nagai, K. Kimoto, H. Kurata
Published online by Cambridge University Press:

23 November 2012, pp. 1032-1033
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Two-step Deconvolution in Electron Energy-loss Spectroscopy on hBN K-edge
R.A. McLeod, M. Malac
Published online by Cambridge University Press:

23 November 2012, pp. 1034-1035
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Morphological Study of Sub-nanometer Noble Metal Clusters by Electron Beam-Assisted Redistribution
S.I. Sanchez, S.A. Bradley, W. Sinkler
Published online by Cambridge University Press:

23 November 2012, pp. 1036-1037
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

An Efficient Technique to Quantify Dislocation Densities Imaged Through Annular Dark Field Scanning Transmission Electron Microscopy
C.T. Schamp, P.Y. Hung, B.G. Min
Published online by Cambridge University Press:

23 November 2012, pp. 1038-1039
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Counting number of atoms in metal nanoparticles: Development of quantitative-STEM techniques for a JEM-2100F S/TEM
L. Li, J.C. Yang, Z. Zhang
Published online by Cambridge University Press:

23 November 2012, pp. 1040-1041
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Low Accelerating Voltage, X-ray Microanalysis: Benefits and Challenges
P. McSwiggen, N. Mori, T. Ohta, C. Nielsen
Published online by Cambridge University Press:

23 November 2012, pp. 1042-1043
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microanalysis of the Elemental Distribution in Particlesof Zn(OH)2 Obtained by Chemical Precipitation.
L. Bejar, A. Medina, R. Vargas, G. Herrera, I. Alfonso
Published online by Cambridge University Press:

23 November 2012, pp. 1044-1045
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Volume 18 - October 2012

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-05

Research Article

Breaking the 1% Accuracy Barrier in EPMA

EDS Spectrum Imaging with Fast Fourier Transforms

Trace Analysis Is Worthless If the Peaks Are Misidentified!

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-06

Research Article

Accurate X-ray Mapping and Quantitative Analysis at Tilted Geometries

Multivariate Statistical Analysis tool for the interpretation and the quantification of hyperspectral data: application to 3D EDX/FIB images

Determination of EDS Detection Limits of Nanoparticle Using Monte Carlo Simulations

Towards Quantitative X-ray Microanalysis using Manifold Learning

Quantitative EPMA using Bootstrap Methods

Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-07

Research Article

Atomic resolution transmission imaging at 30keV via electron ptychography

Quantitative Confocal Sectioning in Double-Corrected STEM Utilizing Electron Energy Loss Spectroscopy and Post-Specimen Cc Correction

A method to avoid strain field induced artifacts in 2d chemical mapping of dilute GaNAs by HAADF STEM

Solving structure of the interfaces using atomic level energy dispersive x-ray spectroscopy

Visualization of Hybridization States with Atomic Resolution Using STEM-EELS

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-08

Research Article

Two-step Deconvolution in Electron Energy-loss Spectroscopy on hBN K-edge

Morphological Study of Sub-nanometer Noble Metal Clusters by Electron Beam-Assisted Redistribution

An Efficient Technique to Quantify Dislocation Densities Imaged Through Annular Dark Field Scanning Transmission Electron Microscopy

Counting number of atoms in metal nanoparticles: Development of quantitative-STEM techniques for a JEM-2100F S/TEM

Low Accelerating Voltage, X-ray Microanalysis: Benefits and Challenges

Microanalysis of the Elemental Distribution in Particlesof Zn(OH)2 Obtained by Chemical Precipitation.

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Instrumentation Symposium

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-05

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-06

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-07

Research Article

Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-08

Research Article