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A method to avoid strain field induced artifacts in 2d chemical mapping of dilute GaNAs by HAADF STEM

Published online by Cambridge University Press:  23 November 2012

T. Grieb ,
K. Müller ,
M. Schowalter ,
A. Rosenauer ,
R. Fritz ,
K. Volz  and
V. Grillo
T. Grieb
Affiliation:
Universität Bremen, Bremen, Germany
K. Müller
Affiliation:
Universität Bremen, Bremen, Germany
M. Schowalter
Affiliation:
Universität Bremen, Bremen, Germany
A. Rosenauer
Affiliation:
Universität Bremen, Bremen, Germany
R. Fritz
Affiliation:
Universität Marburg, Marburg, Germany
K. Volz
Affiliation:
Universität Marburg, Marburg, Germany
V. Grillo
Affiliation:
S3-NANO CNR, Modena, Italy
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1028 - 1029
Copyright
Copyright © Microscopy Society of America 2012

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