Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

TEM Video Compressive Sensing

Imaging At the Timescale Of Micro- and Milliseconds With the pnCCD (S)TEM Camera

NO2 Hydrogenation over Pt and Rh Catalysts: a Study at The Atomic Level by Field Emission Microscopy

Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime

Characterization of Laser Ablation Dynamics for Nickel Thin Films on Silicon Using Movie Mode Dynamic TEM

A06 Advanced Analytical TEM/STEM

Abstract

New Approach to Analysis of Noisy EELS Data

Use of a hybrid silicon pixel (Medipix) detector as a STEM detector

Development of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages

Ettention: Building Blocks for Iterative Reconstruction Algorithms

Analysis of TEM tomography artifacts with experiments on model specimens

Rapid 3D Reconstruction in the EDS Tomography by using Iterative Series Reduction (ISER) Method

Moving atomic-resolution imaging into the age of deep data

High-accuracy electron tomography of semiconductor devices

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Progress in Crystallographic Image Processing for Scanning Probe Microscopy

Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films on Magnetic Recording Heads

Characterization of Nanocarrier Complexes with Plasmid DNA using SEM, TEM and AFM

Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy

Comparison of Magnetic Domain Observation by Means of Magnetic Force Mi-croscopy and Lorentz Transmission Electron Microscopy

Use of the Unroofing Technique for AFM Direct Imaging of the Intra-Cellular Structure at High Resolution

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract