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Analysis of TEM tomography artifacts with experiments on model specimens

Published online by Cambridge University Press:  23 September 2015

Jonathan Winterstein
Affiliation:
NIST Center for Nanoscale Science and Technology, Gaithersburg, MD 20899
Joshua Schumacher
Affiliation:
NIST Center for Nanoscale Science and Technology, Gaithersburg, MD 20899
J. Alexander Liddle
Affiliation:
NIST Center for Nanoscale Science and Technology, Gaithersburg, MD 20899
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Abstract

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Copyright © Microscopy Society of America 2015 

References

[1] Midgley, PA & Weyland, M, Ultramicroscopy 96 (2003). p 413.CrossRefGoogle Scholar
[2] Heidari Mezerji, H, Van den Broek, W & Bals, S, Ultramicroscopy 111 (2011), p. 330.CrossRefGoogle Scholar
[3] Venkatakrishnan, SV, Drummy, LF, Jackson, MA, De Graef, M, Simmons, J & Bouman, CA, IEEE Transactions on Image Processing 22 (2013), p. 4532.CrossRefGoogle Scholar
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