Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Lateral Force Microscopy using Nanomanipulation

Correlated Atomic Force Microscopy and Single Molecule Localization Microscopy

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Pushing the Limits on SEM Quantification - Combined Quantification with SDD and Fully Focussing WD detectors

Factors Affecting WDS Performance Superiority over EDS

Enhanced Theoretical Model for Avoiding Mistakes in SEM-EDS Analysis

Quantitative Analysis of Heterogenous Samples by SEM/EDS

Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM

Characterization and Comparison of Detector Systems for Large Area X-ray Imaging

Accurate EPMA Quantification of the First Series Transition Metals using Ll Lines

Multilayer Thin Films as Pseudo-Homogeneous EDX Standards

A Method of Component Extraction of EDS and EELS maps

Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Transmission Electron Microscopic and First-principles Study of SrTiO3/GaAs Hetero-interfaces

Observation of Skyrmions at Room-temperature in Amorphous Fe/Gd Films

A Biomimetic-Computational Approach to Optimizing the Quantum Efficiency of Photovoltaics

Combine Simulation and Experiment EELS to Characterize Ionomer Conformation

Investigation of the Structural and Electronic Properties of Pt/γ-Al2O3, a Model Catalyst System

Analysis of Surface Structures in Ru Nanocatalysts

Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structural Refinement Based on Fluctuation Microscopy

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Orientation Mapping by Precession Transmission Electron Microscopy

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract