Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract

TEM of Nanostructured Organic and Hybrid Materials for Photovoltaic and Battery Applications

Angle-resolved Valence EELS of a Single Crystal Gold Sample

Quantitative Structural Analysis of Nanoparticles Using Electron Pair Distribution Function (ePDF)

Characterization of Metal-doped Mn3O4 Particles by Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy

X-ray Imaging

Abstract

X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors

Identification of New Lithic Clasts in Lunar Breccia 14305 by micro-CT and micro-XRF analysis

Ultra High Solid Angle EDS System Advanced STEM Analysis for FE-SEM

Large Area EDS Mapping: Automated Collection of High Resolution Elemental Maps For Post Acquisition Analysis

Multidimensional Data Sets - Presentation, Evaluation and Extraction

Mineral Analyses & Implications on the Dispersion of Bismuth in the Supergene Environment of Eastern Australia

Investigation of Multiple, Large Area EDS Detectors on an SEM Capable of Various Mounting Geometries for Optimal EDS Analysis

Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy

X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope

High Speed, High Resolution pnCCDs as Two Dimensional Imaging Spectrometers for X-rays and Electrons

Interactive Analysis of Terabyte-sized SEM-EDS Hyperspectral Images

Support Vector Machines for Classification and Quantitative Analysis

Comparison of Principal Component Analysis and Multivariate Curve Resolution-Alternating Least Squares Analysis of XPS Spectral Maps

How to Process Zillions of Spectra from Spectral Imaging Datasets? From Phase-Mapping to Bulk-Chemistry on Micron- to Centimeter Scale Using PARC

Need for Large-Area EDS Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode

Mineral Classification Using Computer-Controlled Scanning Electron Microscopy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract

X-ray Imaging

Abstract