Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract

Atomic Column Elemental Mapping by STEM-Moire Method

Observing Plasmon Damping Effects of Metallic Adhesion Layers in E-Beam Synthesized Nanostructures Using STEM-EELS and Raman Spectroscopy

High Resolution Optical and Vibrational Spectroscopy with Low Loss EELS

The Role of Cation Intermixing, Interfacial Chemistry, and Oxygen Deficiency in Understanding the Properties of the LaFeO3/SrTiO3(100) Interface

Methods for Scanning Transmission Electron Microscopy High Angle Annular Dark Field Based for Three Dimensional Analysis of the Local Composition in Solid Alloys

Structure Analysis of a Hyper-Complex Approximant to Icosahedral Quasicrystal using 3D Electron Diffraction Tomography

Very Large Solid Angle Windowless SDD Applications for Nanostructure and Semiconductor Applications

Investigation of Surface Plasmon Coupling and Damping in Au and Ag Nanoparticle Assemblies by Monochromated Electron Energy Loss Spectroscopy

Electron-Energy Loss and Optical Spectroscopy of Hybrid Nanogap-Antennas on Different Substrates

Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs

Monochromator for Aberration-Corrected STEM

Performance of an Improved TEM SDD Detector

Beam Damage During Energy-Dispersive X-ray Spectroscopy of FePt Nanoparticles

A Comparison of Cross Section Formulas and their Effect on Calculated k-factors

Spatially resolved In and As distributions in InGaAs/GaP and InGaAs/GaAs quantum dot systems

Thermal Stability Study of Ni-Co Core-Shell Nanoparticles by in situ TEM

Comparison of Analysis Routines for EDS and EELS Spectrum Images of Electrical Contacts to Single-Walled Carbon Nanotubes

Monte Carlo Simulation of Electron Energy Loss Spectra of Group III-Nitride Nanoscale Semiconductors

STEM Tomography and Surface Plasmon Imaging of a Au-Pd Bi-metallic Nanorod with Exotic Morphology

Universal Scaling of Surface Plasmon Modes

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract