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Volume 16 - Supplement S2 - July 2010

Contents

Page 34 of 50

Instrumentation and Techniques

Core Facility Management

Abstract

  • Practical Remote Microscopy Using KVM over IP

  • HO Colijn, DE Huber, PC Collins, HL Fraser
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1322-1323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • On-Line Tools for Management of Multi-user Microscopy Facilities

  • D-M Zheng, M Stevens-Kalceff, PR Munroe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Application of LEAN to a Global R&D Microscopy Organization in an Industrial Environment

  • O Guise
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Acoustic and Vibration Considerations for Advanced Microscopy Suites

  • C Papadimos
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1328-1329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Aberration-Corrected STEM Imaging Through Off-Site Remote Operation

  • KA Jarvis, LF Allard, TY Jerome, TC Isabell, DA Blom, PJ Ferreira
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1330-1331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Physical Sciences Symposia

Nanoscale Characterization of Next- Generation Photovoltaic Devices and Materials

Abstract

  • Ab Initio Search for Hydrogen Storage Nanostructured Materials

  • Y-H Kim, Y Sun, J Kang, WI Choi, K Lee, Y Zhao, SB Zhang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1332-1333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Applications of Electron Microscopy in Crystalline Si Solar Cells

  • L Liang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1334-1335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Nanoscale Analysis by EFTEM and FIB-Tomography for Optimization of Thin-Film Silicon Solar Cells

  • DTL Alexander, S Nicolay, P Cuony, M Cantoni, C Ballif
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1336-1337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si

  • SH Vajargah, M Couillard, Y Shao, S Tavakoli, R Kleiman, J Preston, GA Botton
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1338-1339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microscopy Study of Contact Formation of Si Photovoltaic

  • H-C Fang, C-P Liu, H-S Chung, C-L Huang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1340-1341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Analyzing Solar Cell Material Properties with Confocal Raman Imaging

  • T Dieng, J Yang, A Jauss, U Schmidt, O Hollricher
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1342-1343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Solar Review: Characterizing Thin Film Photovoltaics

  • K Dovidenko, J Cournoyer, D Vernooy, B Lita, F Seymour
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1344-1345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • (Scanning) Transmission Electron Microscope Study on the Misfit Layer Compounds (NbSe2)4(PbSe)4

  • S Xie, NT Nguyen, DC Johnson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1346-1347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic Structure of Ultra-Thin WSe2 Films Based on HRTEM Analysis

  • S Rouvimov, P Plachinda, M Beekman, NT Nguyen, D Johnson, P Moeck, EF Rauch
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1348-1349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Lattice-Matched II-VI/III-V Materials and Virtual Substrates for Multijunction Solar-Cell Applications

  • L Ouyang, X-B Zhang, S Wang, X Lu, Y-H Zhang, X Liu, J Furdyna, DJ Smith
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1350-1351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter Diffraction

  • MM Nowell, JO Carpenter, SI Wright
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1352-1353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Asymmetrically Contacted Carbon Nanotubes and Their Photovoltaic Properties

  • S Wang, L-M Peng
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1354-1355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Analytical Electron Microscopy of ZnO Bipods Grown From Solutions

  • G Drazic, M Bitenc, P Podbrscek, Z Crnjak-Orel
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1356-1357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Structural Study of a Carbon Nanofiber Silicon Composite Electrode for Advanced Lithium Batteries

  • MP Balogh, M Nazri, GA Nazri
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1358-1359
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 34 of 50