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Nanoscale Analysis by EFTEM and FIB-Tomography for Optimization of Thin-Film Silicon Solar Cells

Published online by Cambridge University Press:  01 August 2010

DTL Alexander ,
S Nicolay ,
P Cuony ,
M Cantoni  and
C Ballif
DTL Alexander
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
S Nicolay
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
P Cuony
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
M Cantoni
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
C Ballif
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1336 - 1337
Copyright
Copyright © Microscopy Society of America 2010