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Volume 16 - Supplement S2 - July 2010

Contents

Page 36 of 50

Physical Sciences Symposia

Imaging and Spectroscopy of Interfaces and Surfaces in Advanced Materials and Nanostructures

Abstract

  • ZnO Epitaxy on (111) Silicon Using Intervening Bixbyite Oxide Buffer Layers

  • M Katz, W Guo, A Allenic, Y Chen, Y Zhang, CT Nelson, T Heeg, W Tian, C Adamo, D Schlom, X Pan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1402-1403
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Surface Kinetics of the Initial Oxidation Stages of Cu and Cu Alloys

  • JC Yang, Y Kang, L Luo, C Fleck, M Lee, A McGaughey, JA Eastman, G Zhou
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1406-1407
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microstructure and Interfacial Analysis of Multiferroic Tunnel Junction Interfaces

  • SRK Sundaram, N Valanoor, P Munroe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1408-1409
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Structural Evolution of Overcharged LiNiO2-Based Cathode Materials during Thermal Decomposition Studied by in-situ TEM

  • L Wu, Y Zhou, X Wang, X-Q Yang, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1410-1411
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In Situ Observation of Au/TiO2 Catalysts in Reactant Gases by Environmental Transmission Electron Microscopy

  • Y Kuwauchi, H Yoshida, T Uchiyama, T Akita, H Kohno, S Takeda
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1414-1415
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microscopy and Microanalysis of Grain Boundaries in Cerium Oxide

  • JP Winterstein, CB Carter, W Grogger, F Hofer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1416-1417
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • In Situ TEM Observation of Domain Nucleation and Domain Wall-Defect Interactions in Bismuth Ferrite Under Applied DC Bias

  • CR Winkler, LW Martin, CL Johnson, ML Taheri
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1418-1419
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic and Electronic Structure of SrTiO3/GaAs Hetero-Interfaces

  • Q Qiao, RF Klie, S Ogut
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1422-1423
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Revealing Local Dynamics of Domain Growth in a Ferroelectric Material by In-Situ STEM-SPM

  • HJ Chang, SV Kalinin, P Wu, SY Yang, P Yu, R Ramesh, LQ Chen, SJ Pennycook, AY Borisevich
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1424-1425
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Structural Stability and Release Behavior of Iron Nanocrystals Encapsulated in Carbon Shells by In Situ TEM/HRTEM Observation

  • Z Liu, N Aguiló-Aguayo, E Bertran, J Yang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1426-1427
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging and Spectroscopy of Interfaces and Surfaces with Advanced Electron Microscopy

  • Y Zhu, H Inada, D Su, L Wu, J Ciston, C Jooss, J Norpoth, J Wall
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1430-1431
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microstructure and Defects of Co-Doped BaFe2As2 Single Crystal Thin Films

  • Y Zhang, CT Nelson, S Lee, J Jiang, DC Larbalestier, CB Eom, XQ Pan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1432-1433
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Electron Spectroscopic Imaging of DNA Molecules along Carbon Nanotubes by Aberration-Corrected Transmission Electron Microscopy

  • LF Dong, CY Song, B Jiang, QQ Liu, T Duden
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1434-1435
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Low-loss EFTEM Imaging of Surface Plasmon Resonances in Ag Nanostructures

  • PA van Aken, W Sigle, CT Koch, B Ögüt, J Nelayah, L Gu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1438-1439
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Electron Energy Loss Spectroscopy Study of Li in Lithiated FeOF/C Nanocomposite Battery Materials

  • KS Rao, N Pereira, G Amatucci, F Cosandey
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1440-1441
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 36 of 50