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Aberration-Corrected STEM Imaging Through Off-Site Remote Operation

Published online by Cambridge University Press:  01 August 2010

KA Jarvis ,
LF Allard ,
TY Jerome ,
TC Isabell ,
DA Blom  and
PJ Ferreira
KA Jarvis
Affiliation:
University of Texas at Austin
LF Allard
Affiliation:
Oak Ridge National Laboratory
TY Jerome
Affiliation:
Oak Ridge National Laboratory
TC Isabell
Affiliation:
JEOL USA
DA Blom
Affiliation:
University of South Carolina
PJ Ferreira
Affiliation:
The University of Texas at Austin

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1330 - 1331
Copyright
Copyright © Microscopy Society of America 2010