Proceedings of Microscopy & Microanalysis 2013
Instrumentation Sciences
A07.P1 Mass Spectrometry Imaging (MSI): Applications, Current Challenges and Perspectives
Abstract
Imaging of Lipids, Metabolites and Drugs with Nanospray Desorption Electrospray Ionization Mass Spectrometry
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- 09 October 2013, pp. 680-681
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MSI MALDI-MS for Direct Lipid Profiling of Intact Tissues
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- 09 October 2013, pp. 682-683
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A08.01 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research
Abstract
Strain Mapping with Electron Back Scatter Diffraction: Sensitivity Studies and Pattern Remapping
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- 09 October 2013, pp. 684-685
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Quantification of Epitaxial Strain and Crystal Structure in Nanoscale Oxide Films Using Position Averaged Convergent Beam Electron Diffraction
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- 09 October 2013, pp. 686-687
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High Angular Accuracy EBSD based on a 3D Hough Transform
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- 09 October 2013, pp. 688-689
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Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si
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- 09 October 2013, pp. 690-691
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A08.02 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research
Abstract
Characterizing Severely Plastically Deformed Materials Using Transmission Kikuchi Diffraction and Energy Dispersive X-ray Spectroscopy in the Scanning Electron Microscope
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- 09 October 2013, pp. 692-693
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Transmission EBSD - Bridging the Gap between SEM and TEM
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- 09 October 2013, pp. 694-695
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New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD
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- 09 October 2013, pp. 696-697
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Femtosecond Laser Tomography Using the TriBeam System
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- 09 October 2013, pp. 698-699
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A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research
Abstract
Ultra-fast TEM electron diffraction tomography
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- 09 October 2013, pp. 700-701
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Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession
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- 09 October 2013, pp. 702-703
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Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction
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- 09 October 2013, pp. 704-705
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Towards Sub-Angström Ptychographic Diffractive Imaging
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- 09 October 2013, pp. 706-707
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Application of diffraction mapping on crystal grain imaging
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- 09 October 2013, pp. 708-709
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Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further
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- 09 October 2013, pp. 710-711
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A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research
Abstract
Characterizing Local Misorientation Gradients Near Grain Boundaries
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- 09 October 2013, pp. 712-713
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Evolution of Microstructure and Microtexture in Friction Stir Welded Oxide Dispersion Strengthened Steel
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- 09 October 2013, pp. 714-715
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Quantitative, 3D Studies of the Evolution of Grain Size and Orientation in Nano- grained, Polycrystalline Thin-Films
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- 09 October 2013, pp. 716-717
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Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques
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- 09 October 2013, pp. 718-719
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