Microscopy and Microanalysis: Volume 19 - Proceedings of Microscopy & Microanalysis 2013

< Back to all issues

Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013

Contents

Page 18 of 52

Instrumentation Sciences

A07.P1 Mass Spectrometry Imaging (MSI): Applications, Current Challenges and Perspectives

Abstract

Imaging of Lipids, Metabolites and Drugs with Nanospray Desorption Electrospray Ionization Mass Spectrometry
I. Lanekoff, R. Chu, C. Anderton, C. Mahoney, L. Paša-Tolić, J. Smith, C. Timchalk, M. Thomas, J. Carson, K. Burnum, A. Konopka, J. Laskin
Published online by Cambridge University Press:

09 October 2013, pp. 680-681
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

MSI MALDI-MS for Direct Lipid Profiling of Intact Tissues
C. Lydon, E. Schenk, J.D. DeBord, M. Smotherman, F. Fernandez-Lima
Published online by Cambridge University Press:

09 October 2013, pp. 682-683
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.01 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Strain Mapping with Electron Back Scatter Diffraction: Sensitivity Studies and Pattern Remapping
J. Jiang, T.B. Britton, A.J. Wilkinson
Published online by Cambridge University Press:

09 October 2013, pp. 684-685
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Quantification of Epitaxial Strain and Crystal Structure in Nanoscale Oxide Films Using Position Averaged Convergent Beam Electron Diffraction
J. Hwang, J.Y. Zhang, J. Son, E. Mikheev, A.J. Hauser, S. Stemmer
Published online by Cambridge University Press:

09 October 2013, pp. 686-687
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

High Angular Accuracy EBSD based on a 3D Hough Transform
C. Maurice, A.P. Day, R. Fortunier
Published online by Cambridge University Press:

09 October 2013, pp. 688-689
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si
M.D. Vaudin, W.A. Osborn, L.H. Friedman, R.F. Cook
Published online by Cambridge University Press:

09 October 2013, pp. 690-691
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.02 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Severely Plastically Deformed Materials Using Transmission Kikuchi Diffraction and Energy Dispersive X-ray Spectroscopy in the Scanning Electron Microscope
P. Trimby
Published online by Cambridge University Press:

09 October 2013, pp. 692-693
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Transmission EBSD - Bridging the Gap between SEM and TEM
A. Avishai, J. Carter, M. Zahiri Azar, B. Narayanan, A.H. Heuer
Published online by Cambridge University Press:

09 October 2013, pp. 694-695
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD
R.H. Geiss, K.P. Rice, R.R. Keller
Published online by Cambridge University Press:

09 October 2013, pp. 696-697
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Femtosecond Laser Tomography Using the TriBeam System
T.M. Pollock, M.P. Echlin, A. Mottura
Published online by Cambridge University Press:

09 October 2013, pp. 698-699
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Ultra-fast TEM electron diffraction tomography
S. Nicolopoulos, M. Gemmi
Published online by Cambridge University Press:

09 October 2013, pp. 700-701
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession
A.D. Darbal, R.D. Narayan, C. Vartuli, G. Lian, R. Graham, F. Shaapur, S. Nicolopoulos, J.K. Weiss
Published online by Cambridge University Press:

09 October 2013, pp. 702-703
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction
C. Kuebel, A. Kobler, P. Gruber, J. Lohmiller, O. Kraft, C. Braun, M. Grewer, R. Birringer, H. Hahn
Published online by Cambridge University Press:

09 October 2013, pp. 704-705
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Towards Sub-Angström Ptychographic Diffractive Imaging
P. Wang, D.J. Batey, J.M. Rodenburg, H. Sawada, A.I. Kirkland
Published online by Cambridge University Press:

09 October 2013, pp. 706-707
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Application of diffraction mapping on crystal grain imaging
S. Wang
Published online by Cambridge University Press:

09 October 2013, pp. 708-709
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further
Y. Martin, J.-M. Zuo, V. Favre-Nicolin, J.-L. Rouvière
Published online by Cambridge University Press:

09 October 2013, pp. 710-711
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Local Misorientation Gradients Near Grain Boundaries
S. Wright, M.M. Nowell, L.H. Chan
Published online by Cambridge University Press:

09 October 2013, pp. 712-713
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Evolution of Microstructure and Microtexture in Friction Stir Welded Oxide Dispersion Strengthened Steel
B.W. Baker, S. Menon, L.N. Brewer
Published online by Cambridge University Press:

09 October 2013, pp. 714-715
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Quantitative, 3D Studies of the Evolution of Grain Size and Orientation in Nano- grained, Polycrystalline Thin-Films
A.B. Aebersold, C. Hébert, D.T.L. Alexander
Published online by Cambridge University Press:

09 October 2013, pp. 716-717
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques
J. Poplawsky, C. Li, N. Paudel, Y. Yan, S. Pennycook
Published online by Cambridge University Press:

09 October 2013, pp. 718-719
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 18 of 52

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2013

Instrumentation Sciences

A07.P1 Mass Spectrometry Imaging (MSI): Applications, Current Challenges and Perspectives

Abstract

Imaging of Lipids, Metabolites and Drugs with Nanospray Desorption Electrospray Ionization Mass Spectrometry

MSI MALDI-MS for Direct Lipid Profiling of Intact Tissues

A08.01 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Strain Mapping with Electron Back Scatter Diffraction: Sensitivity Studies and Pattern Remapping

Quantification of Epitaxial Strain and Crystal Structure in Nanoscale Oxide Films Using Position Averaged Convergent Beam Electron Diffraction

High Angular Accuracy EBSD based on a 3D Hough Transform

Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si

A08.02 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Severely Plastically Deformed Materials Using Transmission Kikuchi Diffraction and Energy Dispersive X-ray Spectroscopy in the Scanning Electron Microscope

Transmission EBSD - Bridging the Gap between SEM and TEM

New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD

Femtosecond Laser Tomography Using the TriBeam System

A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Ultra-fast TEM electron diffraction tomography

Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession

Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction

Towards Sub-Angström Ptychographic Diffractive Imaging

Application of diffraction mapping on crystal grain imaging

Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further

A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Local Misorientation Gradients Near Grain Boundaries

Evolution of Microstructure and Microtexture in Friction Stir Welded Oxide Dispersion Strengthened Steel

Quantitative, 3D Studies of the Evolution of Grain Size and Orientation in Nano- grained, Polycrystalline Thin-Films

Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2013

Instrumentation Sciences

A07.P1 Mass Spectrometry Imaging (MSI): Applications, Current Challenges and Perspectives

Abstract

A08.01 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

A08.02 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract