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Strain Mapping with Electron Back Scatter Diffraction: Sensitivity Studies and Pattern Remapping

Published online by Cambridge University Press:  09 October 2013

J. Jiang ,
T.B. Britton  and
A.J. Wilkinson
J. Jiang
Affiliation:
T.B. Britton
Affiliation:
A.J. Wilkinson
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 684 - 685
Copyright
Copyright © Microscopy Society of America 2013