Proceedings of Microscopy & Microanalysis 2013
Instrumentation Sciences
A04.P1 Electron Tomography in Life and Material Science
Abstract
Advances in Microwave-Assisted Freeze Substitution
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- 09 October 2013, pp. 560-561
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EELS Estimation of Ice Accumulation Rates in a Cryo-TEM Equipped with a Multi-Sample Loading Device
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- 09 October 2013, pp. 562-563
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The Development of Bubblegrams is Dose Rate-Dependent
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- 09 October 2013, pp. 564-565
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Electron Tomography of Hydrated Ferritin Particles Using Carbon Nanotube Liquid Cell
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- 09 October 2013, pp. 566-567
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Compressed Sensing Reconstruction of Smooth Signals in Electron Tomography
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- 09 October 2013, pp. 568-569
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The Effect of Noise in Images on Electron Tomography Reconstruction
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- 09 October 2013, pp. 570-571
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Advancing Nanotomography of Polymer Systems
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- 09 October 2013, pp. 572-573
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Optimizing Sampling Schemes for Electron Tomography: Dual- and Multiple-Axis Tomography
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- 09 October 2013, pp. 574-575
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Electron Tomography for 3D Nanoscale Characterization of Semiconductor Materials and Devices
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- 09 October 2013, pp. 576-577
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Electron and X-ray Tomography of Iron/Iron Oxide Redox Reactions for Large-Scale Hydrogen Storage
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- 09 October 2013, pp. 578-579
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Electrostatic Potentials of Nanostructures Revealed in 3D by Electron Holographic Tomography
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- 09 October 2013, pp. 580-581
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A05.01 Revisiting Resolution for STEM and TEM
Abstract
Shall We Still Consider HRTEM Image Simulation to Interpret Micrographs Obtained Using Cs (and Cc) Corrected Electron Microscopes?
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- 09 October 2013, pp. 582-583
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Measuring Atoms in Oxide Heterostructures by Quantitative Aberration-Corrected Transmission Electron Microscopy
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- 09 October 2013, pp. 584-585
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Automated and Objective Numerical Aberration Correction of HRTEM Complex Exit Waves of Crystal Lattices
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- 09 October 2013, pp. 586-587
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Benefits of Chromatic Aberration Correction for Off-axis Electron Holography
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- 09 October 2013, pp. 588-589
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A05.02 Revisiting Resolution for STEM and TEM
Abstract
Cs Corrected Images and What You Don't See: Data Mining to the Physical Limits
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- 09 October 2013, pp. 590-591
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Resolution of the Electron Microscope at the Atomic Scale
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- 09 October 2013, pp. 592-593
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Contribution of Cc-Correction to High-Resolution TEM at All Electron Energy Loss Regimes
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- 09 October 2013, pp. 594-595
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Atomic Structure of Through-Thickness Steps in a Grain Boundary
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- 09 October 2013, pp. 596-597
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Instrumental Resolution Limit By Magnetic Thermal Noise From Conductive Parts
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- 09 October 2013, pp. 598-599
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