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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 16 of 52

Instrumentation Sciences

A05.03 Revisiting Resolution for STEM and TEM

Abstract

  • Addressing Detector Non-Uniformity in Scanning Transmission Electron Microscopy

  • J.M. LeBeau, S.D. Findlay
  • Published online by Cambridge University Press:
    09 October 2013, pp. 600-601
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Effects of Charge Transfer in Atomic Bonding on HAADF-STEM Image Simulation

  • M.L. Odlyzko, K.A. Mkhoyan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 602-603
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electron Beam Channeling in Single Atomic Column

  • A. Mittal, K.A. Mkhoyan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 604-605
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In-situ study of Nb hydride for SRF cavity applications using aberration-corrected STEM and electron energy loss spectroscopy

  • R. Tao, R.F. Klie, L. Cooley, A. Romanenko
  • Published online by Cambridge University Press:
    09 October 2013, pp. 606-607
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • STEM EELS Resolution Revisited

  • M.P. Oxley, S.J. Pennycook
  • Published online by Cambridge University Press:
    09 October 2013, pp. 608-609
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A05.P1 Revisiting Resolution for STEM and TEM

Abstract

  • Assessment of the TEM Information Limit by Means of Tilted Illumination

  • H. Mueller, S. Uhlemann, J. Zach, P. Hartel, M. Haider
  • Published online by Cambridge University Press:
    09 October 2013, pp. 612-613
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Imaging Very Thin Particles in ABF STEM

  • P. Phillips, R.F. Klie
  • Published online by Cambridge University Press:
    09 October 2013, pp. 614-615
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Development and Use of Online Tools in Microscopy and Microanalysis Facilities

  • M. Apperley, J. Whiting, B. Cribb, C. Frost, A. Ceguerra, P. Liddicoat, C. Aya
  • Published online by Cambridge University Press:
    09 October 2013, pp. 616-617
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A06.01 Applications of Micro-CT in Life and Material Sciences

Abstract

  • Using Micro-Computed Tomography In Biomechanical Studies Of Rodent Bone

  • S. Uppuganti, J.S. Nyman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 624-625
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Micro-Computed Tomography in a Museum Environment

  • F. Ahmed, D. Sykes
  • Published online by Cambridge University Press:
    09 October 2013, pp. 626-627
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A06.02 Applications of Micro-CT in Life and Material Sciences

Abstract

  • Micro-CT for Visualization of the Internal Structure of Industrial Materials

  • A. Singhal, Y. Zhou
  • Published online by Cambridge University Press:
    09 October 2013, pp. 628-629
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Nano- scale X-ray Computed Tomography: Morphological Analysis of Fuel Cell Electrodes

  • P. Mandal, W.K. Epting, S. Litster
  • Published online by Cambridge University Press:
    09 October 2013, pp. 630-631
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Synergistic 3D and 2D Imaging of Unique Extraterrestrial Samples for Curation, Sectioning, and Analysis

  • D.S. Ebel, J.M. Friedrich, S.W. Wallace, E.J. Crapster-Pregont, A.J. White
  • Published online by Cambridge University Press:
    09 October 2013, pp. 632-633
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Characterization of Thin Film Composite Membranes Using Porosimetry and X-Ray Microscopy

  • S. Soundara Manickam, J. Gelb, J.R. McCutcheon
  • Published online by Cambridge University Press:
    09 October 2013, pp. 634-635
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A06.P1 Applications of Micro-CT in Life and Material Sciences

Abstract

  • Micro and nano-CT as a valuable and complimentary tool for life science research

  • M.E. Faillace, R.A. Rudolph, O. Brunke
  • Published online by Cambridge University Press:
    09 October 2013, pp. 636-637
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Quantification of Metal-Rich Minerals in Ore Using X-Ray Micro-CT

  • F. Coppens, B. Pauwels
  • Published online by Cambridge University Press:
    09 October 2013, pp. 638-639
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 16 of 52