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Magnetic domain observation in nanocrystalline FeCo Base alloys by Lorentz microscopy and electron holography
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- 07 September 2007, pp. 282-283
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Measuring the 2-Particle-Structure-Factor in Aged FeCr-Samples
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- 07 September 2007, pp. 284-285
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Advanced Electron Microscopy of SiC Added MgB2 Wires and Tapes
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- 07 September 2007, pp. 286-287
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TEM and X-Ray Diffraction Studies on Copper Based Shape Memory Alloy Martensites
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- 07 September 2007, pp. 288-289
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Quantitative Boron-Analysis Using EDX in SEM and TEM
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- 07 September 2007, pp. 290-291
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Quantitative Analysis of Ti-rich and Nb-rich Particles in Medium Carbon Steel
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- 07 September 2007, pp. 292-293
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Characterization of the Microstructure of Al-rich TiAl-Alloys by Combined TEM Imaging Techniques
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- 07 September 2007, pp. 294-295
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Study of oxide precipitates in PM 2000 steel
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- 07 September 2007, pp. 296-297
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Disordering and reordering of bulk Fe-45at.%Al studied by TEM
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- 07 September 2007, pp. 298-299
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Characterization of Stress Corrosion Cracking of Cold Deformed Brass Alloy (CuZn37) Using EBSD
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- 07 September 2007, pp. 300-301
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In-situ TEM Investigation of the Nanocrystallization in Bulk Amorphous NiTi
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- 07 September 2007, pp. 302-303
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Integration of Functional Epitaxial Oxides into Silicon: A TEM Investigation
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- 07 September 2007, pp. 304-305
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Influence of FIB-Preparation on the Potential Structure of Complementarily Doped Semiconductors Investigated by Electron-Holographic Methods
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- 07 September 2007, pp. 306-307
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Growth-correlated structural and chemical properties of ZnTe nanowires
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- 07 September 2007, pp. 308-309
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Twinning in Clathrate-II Germanium
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- 07 September 2007, pp. 310-311
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Concentration Measurement In Free-Standing InGaN Nano-Islands With Transmission Electron Microscopy
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- 07 September 2007, pp. 312-313
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Analytical TEM Investigations of Si Nanowires grown by the VLS Mechanism from Au Templates
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- 07 September 2007, pp. 314-315
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Influence of InGaAs cap layers with different In-concentrations on the structure and properties of InAs/GaAs quantum dot layers
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- 07 September 2007, pp. 316-317
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Towards Quantification of the In-Distribution in InGaAs Quantum Dots
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- 07 September 2007, pp. 318-319
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Composition Analysis of Ternary Semiconductors by Combined Application of Conventional TEM and HRTEM
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- 07 September 2007, pp. 320-321
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