Research Article
Real Structures and Structural Modifications of Ag2+xSe Thin Films
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 402-403
-
- Article
- Export citation
Investigating the Oxide Barrier Layer in Ta-Co-Cu-Co/Oxide/Co-NiMn Spin Valve Structures.
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 404-405
-
- Article
- Export citation
TEM investigation of sputtered and epitaxial grown indium oxide layers for ozone sensors
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 406-407
-
- Article
- Export citation
TEM and SEM characterizations of Aligned ZnO Nanorods on Si Substrates
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 408-409
-
- Article
- Export citation
Microstructure of YBa2Cu3O7-δ/SrTiO3/BaZrO3 Multilayer Films on MgO Substrates
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 410-411
-
- Article
- Export citation
TEM thin film analysis of chemically deposited YBa2Cu3O7-x coated conductors
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 412-413
-
- Article
- Export citation
A Comparison of the Electronic Structure of N-K in TiN and VN using EELS and Ab-initio Calculations
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 414-415
-
- Article
- Export citation
Electron Holography on Charge - Modulated Structures: Evidence for Intrinsic Wide-Spaced Electric Fields
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 416-417
-
- Article
- Export citation
Strain Mapping along an Al-Pb Interface
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 418-419
-
- Article
- Export citation
Formation of rare earth zirconia pyrochlores on yttria-stabilized ZrO2 single crystals by solid state reactions
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 420-421
-
- Article
- Export citation
Investigation of the Structure of Plasma Erosion Craters using a SEM/FIB Dual Beam Workstation
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 422-423
-
- Article
- Export citation
High-resolution TEM and diffraction study of layer stacking and long-period undulations in the incommensurate misfit layer compound (PbS)1.14NbS2
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 424-425
-
- Article
- Export citation
Electron Magnetic Linear Dichroism (EMLD) and Electron Magnetic Circular Dichroism (EMCD) in Electron Energy-Loss Spectroscopy
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 426-427
-
- Article
- Export citation
Measurement of the ratio of substitutional to interstitial dopant-incorporation in nanostructures
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 428-429
-
- Article
- Export citation
Analytical TEM Investigation of Size Effects in SnO2 Nanoparticles Produced by Microwave Plasma Synthesis
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 430-431
-
- Article
- Export citation
Applied Nanoanalysis by Electron Energy-Loss Spectrum Imaging Methods
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 432-433
-
- Article
- Export citation
STEM, EDXS and EFTEM Investigations of Sn-Pd and Co-Ni Nanoparticles with Core-Shell Structures
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 434-435
-
- Article
- Export citation
TEM/EELS/XRD Investigation of the Graphitization Process in Carbonaceous Materials
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 436-437
-
- Article
- Export citation
Chemical Analysis of Tungsten Tips by EDX Line Scan Tomography
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 438-439
-
- Article
- Export citation
Electron microscopy investigation of polymer single crystals, after fifty years
-
- Published online by Cambridge University Press:
- 07 September 2007, pp. 440-441
-
- Article
- Export citation