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TEM of Free Standing InAs Nanoplates Grown by Molecular Beam Epitaxy
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- 07 September 2007, pp. 322-323
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TEM Investigations of (In,Ga)N/GaN Laser Structures
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- 07 September 2007, pp. 324-325
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Structural Analysis of c-plane GaN Layers Grown on (100) g-LiAlO2
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- 07 September 2007, pp. 326-327
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Cathodoluminescence of Ion-Implanted Silica Layers
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- 07 September 2007, pp. 328-329
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Combined HRXRD and EELS Investigations of SiGe/Si(001) Islands Grown by Means of Liquid Phase Epitaxy
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- 07 September 2007, pp. 330-331
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Structural, Chemical And Electronic Characterization Of Ceramic Materials Using Quantitative (Scanning) Transmission Electron Microscopy.
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- 07 September 2007, pp. 332-333
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Mapping Grain Boundary Potentials by Inline Electron Holography
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- 07 September 2007, pp. 334-335
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Energy Filtered TEM Applied to Mineralogical Issues
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- 07 September 2007, pp. 336-337
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Some Prospects of Transmission Electron Microscopy in Materials Science
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- 07 September 2007, pp. 338-339
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TEM Study of the Order, Disorder and Structural Modulations in Bi4Fe1/3W2/3O8Br
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- 07 September 2007, pp. 340-341
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Electron Microscopy Studies of Sol-Gel Derived 8YSZ Thin Films for SOFC Applications
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- 07 September 2007, pp. 342-343
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Microstructure of Sol-Gel deposited La1 xSrxCoO3-£_ Thin Films
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- 07 September 2007, pp. 344-345
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Conventional Imaging of Nanopores in Surface Finishing Anodized Coatings
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- 07 September 2007, pp. 346-347
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Al2O3-Coatings after Long-Term Heat Treatment - A TEM-Study
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- 07 September 2007, pp. 348-349
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Domain structure and grain boundaries in ferroelectric BaTiO3 PTCR ceramics
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- 07 September 2007, pp. 350-351
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Stress, strain and electric field calculation for dislocations and their contrast under two-beam conditions: implementation in Matlab
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- 07 September 2007, pp. 352-353
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Comparison between stoichiometric and nonstoichiometric LaSrCo-oxides by analytical TEM
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- 07 September 2007, pp. 354-355
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Nanostripes in (Nd,Eu,Gd)Ba2Cu3Ox (NEG) Single Crystals
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- 07 September 2007, pp. 356-357
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Structuring of Permalloy by means of Electron-beam Lithography and Focused Ion Beam Milling
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- 07 September 2007, pp. 358-359
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EBSD-Analysis of Nanoparticles Embedded in High-Tc Superconductors
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- 07 September 2007, pp. 360-361
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