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Composition Analysis of Ternary Semiconductors by Combined Application of Conventional TEM and HRTEM

Published online by Cambridge University Press:  07 September 2007

I Häusler ,
H Kirmse  and
W Neumann
I Häusler
Affiliation:
Humboldt-Universität zu Berlin,Germany
H Kirmse
Affiliation:
Humboldt-Universität zu Berlin,Germany
W Neumann
Affiliation:
Humboldt-Universität zu Berlin,Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 320 - 321
Copyright
Copyright © Microscopy Society of America 2007

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