Microscopy and Microanalysis: Volume 27 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

On the Voltage and Bowl Correction of Trigger-Uncorrelated Multihit Events

Isotopic Analysis of Irradiated Ceramic Fuel for Burnup and Microchemical Assessment Using Atom Probe Tomography.

Evaporation Dynamics of Boron Dopants in Silicon

Analytical Sciences Symposia

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing

Alternative Post-FIB Polishing Using Low-Energy Argon Ion Milling to Prevent Grid Redeposition

The combined use of SEM, EPMA and FIB for the characterization of novel biomaterials for bone regeneration

Electron Irradiation Cleaning of the SEM and its Samples

Improved Focused Ion Beam Sample Preparation Techniques for Transmission Electron Microscopy and Failure Analysis of Memristor Devices

Evaluation of Gallium Ion\Xe Plasma Beam for Patterning of Suspended Silicon Nitride Membranes

Operando Investigation of Energy Storage Material by FIB-SEM System

Investigation of the effect of gallium ion (Ga+) irradiation on the fluorescence properties of synthetic microdiamonds

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy

Hierarchically Structured Classification of Carbon Nanostructures from TEM Images by Machine Learning and Computer Vision

Characterization of III/V Semiconductors on Silicon by Analyzing 4D-STEM Data with Convolutional Neural Networks

Smart EPU: SPA Getting Intelligent

Dual source X-ray and electron SEM system: Elemental mapping of an Epithermal gold-bearing sample from Karangahake, New Zealand

Tool Readiness for TEM

A Deep Learning Approach to Retrieving 3D Structure Information from High Resolution Time-Resolved TEM Images

Superior Neural Network for Distinguishing Between Atomic Species

Automated Experiment in SPM: Bayesian Optimization for efficient searching of parameter space to maximize functional response

Lossless Deep Image Compression at the Edge for 3D Electron Microscopy

Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Analytical Sciences Symposia

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy