7 results
Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2200-2201
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- August 2022
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Development of High-Speed Scan System for Atomic Resolution STEM
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2710-2712
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- August 2021
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Development of Ultrahigh Resolution Objective Lens Enabling High Analytical Sensitivity
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3126-3128
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- August 2020
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TV-rate Atomic-resolution STEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1150-1151
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- August 2020
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STEM and Elemental Analysis by EDS and EELS for Two-dimensional Atomic Structure Containing Au and Cu
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1776-1777
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- August 2019
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Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 318-319
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- July 2016
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Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1861-1862
- Print publication:
- August 2015
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