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Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope

Published online by Cambridge University Press:  23 September 2015

Takeo Sasaki ,
Hidetaka Sawada ,
Eiji Okunishi ,
Yu Jimbo ,
Yorinobu Iwasawa ,
Koji Miyatake ,
Shuichi Yuasa  and
Toshikatsu Kaneyama

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1861 - 1862
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Kawai, S, et al, Microsc. Microanal. 20(Suppl. 3 (2014) 1150–1151.CrossRefGoogle Scholar
[2] Sawada, H, etal, Microsc. Microanal. 20(Suppl. 3 (2014) 124–125.CrossRefGoogle Scholar