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Institutional Considerations in Strengthening On-farm Client-Oriented Research in National Agricultural Research Systems: Lessons from a Nine-Country Study
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- Experimental Agriculture / Volume 27 / Issue 4 / October 1991
- Published online by Cambridge University Press:
- 03 October 2008, pp. 343-373
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Atomistic Modeling of Point and Extended Defects in Crystalline Materials
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- MRS Online Proceedings Library Archive / Volume 532 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 43
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- 1998
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Atomistic Model of Transient Enhanced Diffusion and Clustering of Boron In Silicon
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- MRS Online Proceedings Library Archive / Volume 469 / 1997
- Published online by Cambridge University Press:
- 15 February 2011, 341
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- 1997
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Impact of Metal Contamination of 7.0nm Gate Oxides on Various Substrate Materials
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- MRS Online Proceedings Library Archive / Volume 473 / 1997
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- 10 February 2011, 141
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- 1997
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The effect of the extra ion on residual damage in MeV implanted Si
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- MRS Online Proceedings Library Archive / Volume 469 / 1997
- Published online by Cambridge University Press:
- 15 February 2011, 187
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- 1997
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Impact of Metal Contamination of 7.0nm Gate Oxides on Various Substrate Materials
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- MRS Online Proceedings Library Archive / Volume 477 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 81
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- 1997
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Recovery Kinetics of Phosphorus Ion-Implanted a-Si:H
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- MRS Online Proceedings Library Archive / Volume 420 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 653
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- 1996
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Energetic Ion Beams in Semiconductor Processing: Summary of a Doe Panel Study
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- MRS Online Proceedings Library Archive / Volume 396 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 859
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- 1995
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Simultaneous Relaxation of Network and Defects in Silicon-Implanted a-Si:H*
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- MRS Online Proceedings Library Archive / Volume 377 / 1995
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- 15 February 2011, 173
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- 1995
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Properties of Point-Defects in Si for Process Modeling
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- MRS Online Proceedings Library Archive / Volume 389 / 1995
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- 15 February 2011, 3
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- 1995
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Measuring Vacancy Diffusivity and Vacancy Assisted Clustering by Nitridation Enhanced Diffusion of Sb IN Si(100) Doping Superlattices
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- MRS Online Proceedings Library Archive / Volume 355 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 157
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- 1994
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Correlation of Electrical, Structural, and Optical Properties of Erbium in Silicon
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- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 447
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- 1993
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Ion Implanted Calibration Standards for Si Surface Contamination Detection by Txrf
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- MRS Online Proceedings Library Archive / Volume 315 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 347
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- 1993
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Correlation of Electrical, Structural, and Optical Properties of Erbium In Silicon
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- MRS Online Proceedings Library Archive / Volume 301 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 119
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- 1993
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The Energy Dependence of Ion Damage in A1xGa1−xAs/GaAs HETErostructures and The Effects of Implanted Impurity
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- MRS Online Proceedings Library Archive / Volume 235 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 229
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- 1991
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Mesotaxy Layers of IrSi3 in (111)Si Formed by MeV ION Implantation
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- MRS Online Proceedings Library Archive / Volume 235 / 1991
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- 28 February 2011, 279
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- 1991
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Local structure around Er in MeV Er-implanted silica
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- MRS Online Proceedings Library Archive / Volume 244 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 381
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- 1991
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Erbium-defect interactions in silica films implanted with MeV Er ions
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- MRS Online Proceedings Library Archive / Volume 235 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 377
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- 1991
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Changing Segregation Coefficients During Ion Beam Induced Epitaxy of Amorphous Si
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- MRS Online Proceedings Library Archive / Volume 201 / 1990
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- 26 February 2011, 363
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- 1990
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The Effect of Hydrogen on the Kinetics of Solid Phase Epitaxy in Amorphous Silicon
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- MRS Online Proceedings Library Archive / Volume 205 / 1990
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- 26 February 2011, 45
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- 1990
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