40 results
A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation
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- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 24 June 2022, pp. 1632-1640
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- October 2022
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Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value
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- Microscopy and Microanalysis / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 27 July 2021, pp. 744-757
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- August 2021
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Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
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- Microscopy and Microanalysis / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 25 June 2021, pp. 794-803
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- August 2021
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Mapping Cation Disorder in Irradiated Gd2Ti2O7 Pyrochlore by 4D-STEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1560-1561
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- August 2019
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Advanced Phase Reconstruction Methods Enabled by Four-Dimensional Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 10-11
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- August 2019
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Atomic Resolution Probing of Phase Transformations and Domain Evolution During Large Superelastic Deformation in Ferroelectrics with in situ TEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1850-1851
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- August 2019
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Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1834-1835
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- August 2019
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High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1960-1961
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- August 2019
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Structure Retrieval of Strongly Scattering Materials in the Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 76-77
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- August 2019
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The 4D Camera: Very High Speed Electron Counting for 4D-STEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1930-1931
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- August 2019
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Rapid Simulation of Elemental Maps in Core-Loss Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 574-575
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- August 2019
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Three-Dimensional Polarization by Means of Scanning HOLZ-CBED Technique
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 178-179
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- August 2018
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A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 166-167
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- August 2018
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Nanobeam Scanning Diffraction for Orientation Mapping of Polymers
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1782-1783
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- July 2017
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Nanoscale Strain Mapping During in situ Deformation of Annealed Al-Mg Alloys
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 522-523
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- July 2016
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Local strain measurements during in situ TEM deformation with nanobeam electron diffraction
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 710-711
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- July 2016
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Phase Contrast Imaging of Weakly-Scattering Samples with Matched Illumination and Detector Interferometry–Scanning Transmission Electron Microscopy (MIDI–STEM)
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 460-461
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- July 2016
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Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Diffraction
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 502-503
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- July 2016
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Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 470-471
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- July 2016
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Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1097-1098
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- August 2015
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