Skip to main content Accessibility help
×
Home

Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

Published online by Cambridge University Press:  05 August 2019


J. Miao
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
L. Casalena
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
J. Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA.
T. Pekin
Affiliation:
Institut für Physik, Humboldt-Universität zu Berlin, Berlin, Germany.
M. Ghazisaeidi
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
M. J. Mills
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
Corresponding
E-mail address:

Abstract

Image of the first page of this article

Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ophus, C et al. , Microscopy and Microanalysis 20 (2014), p. 62.CrossRefGoogle Scholar
[2]Ozdol, VB et al. , Applied Physics Letters 106 (2015), p. 253107.CrossRefGoogle Scholar
[3]Miao, J et al. , Microscopy and Microanalysis 24 (2018), p. 2202.CrossRefGoogle Scholar
[4]Miao, J et al. , Acta Materialia 132 (2017), p. 35.CrossRefGoogle Scholar
[5]The authors acknowledge financial support from The National Science Foundation, Division of Materials Research under contract # #DMR-60050072. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. JC acknowledges support from the DOE Early Career Research Program.Google Scholar

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 176 *
View data table for this chart

* Views captured on Cambridge Core between 05th August 2019 - 4th December 2020. This data will be updated every 24 hours.

Access
Hostname: page-component-b4dcdd7-9fdqb Total loading time: 0.278 Render date: 2020-12-04T19:04:34.508Z Query parameters: { "hasAccess": "1", "openAccess": "0", "isLogged": "0", "lang": "en" } Feature Flags last update: Fri Dec 04 2020 18:59:38 GMT+0000 (Coordinated Universal Time) Feature Flags: { "metrics": true, "metricsAbstractViews": false, "peerReview": true, "crossMark": true, "comments": true, "relatedCommentaries": true, "subject": true, "clr": false, "languageSwitch": true }

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM
Available formats
×
×

Reply to: Submit a response


Your details


Conflicting interests

Do you have any conflicting interests? *