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High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM

Published online by Cambridge University Press:  05 August 2019

Frances I. Allen*
Affiliation:
Department of Materials Science and Engineering, UC Berkeley, Berkeley, CA, USA. National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA.
Thomas C. Pekin*
Affiliation:
Department of Materials Science and Engineering, UC Berkeley, Berkeley, CA, USA. National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA.
Arun Persaud
Affiliation:
Accelerator Technology and Applied Physics Division, LBNL, Berkeley, CA, USA.
Steven J. Rozeveld
Affiliation:
Core R&D – Analytical Sciences, The Dow Chemical Company, Midland, MI, USA.
Gregory F. Meyers
Affiliation:
Core R&D – Analytical Sciences, The Dow Chemical Company, Midland, MI, USA.
Jim Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA.
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA.
Andrew M. Minor
Affiliation:
Department of Materials Science and Engineering, UC Berkeley, Berkeley, CA, USA. National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA.
*
*Corresponding author: francesallen@berkeley.edu
**Current address: Department of Physics, Humboldt University of Berlin, Berlin, Germany.
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Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Pekin, TC et al. , Scripta Materialia 146 (2018), p. 87.CrossRefGoogle Scholar
[2]Jiang, Y et al. , Nature 559 (2018), p. 343.CrossRefGoogle Scholar
[3]Pekin, TC et al. , Ultramicroscopy 176 (2017), p. 170.CrossRefGoogle Scholar
[4]The authors acknowledge support from the Dow University Partnership Initiative Program. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar
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High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM
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