11 results
Monochromatic STEM-EELS for Correlating the Atomic Structure and Optical Properties of Two-Dimensional Materials
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 96-97
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- August 2014
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Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1066-1067
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- August 2014
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High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 70-71
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- August 2014
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Microscopy Applications in the Semiconductor Industry
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 530-531
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- August 2007
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Analysis of Nano-scale Strain Near Shallow Trench Isolation Structures by Energy-filtered Convergent Beam Electron Diffraction
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 938-939
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- August 2006
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Aberration Corrected Microscopy and Moore’s Law: Capabilities Aiding Progress for the Next Decade
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2138-2139
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- August 2005
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Electron Tomography of Microelectronic Device Interconnects
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2090-2091
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- August 2005
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Electron Tomography of Microelectronic Devices
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 22 July 2003, pp. 502-503
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- August 2003
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HRTEM Image Simulations of Structural Defects in Gate Oxides
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1078-1079
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- August 2000
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Effects of Ion Species and Energy on the Amorphization of Si During FIB TEM Sample Preparation as Determined by Computational and Experimental Methods
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 526-527
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- August 2000
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HRTEM Image Simulations for Gate Oxide Metrology
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1080-1081
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- August 2000
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