12 results
Instability analysis of charges trapped in the oxide of metal-ultra thin oxide-semiconductor structures
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- Journal:
- The European Physical Journal - Applied Physics / Volume 31 / Issue 3 / September 2005
- Published online by Cambridge University Press:
- 14 September 2005, pp. 169-178
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- September 2005
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Low loss silica waveguides containing Si nanocrystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 817 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, L4.1
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- 2004
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Pump-probe experiments on low loss silica waveguides containing Si nanocrystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 832 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, F10.11
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- 2004
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Ionizing irradiation effect on the current-voltage characteristics of the metal/ultra-thin oxide/semiconductor structures
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- Journal:
- The European Physical Journal - Applied Physics / Volume 8 / Issue 2 / September 1999
- Published online by Cambridge University Press:
- 15 September 1999, pp. 171-178
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- September 1999
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Atomic Structure of the Interfaces Between Silicon Directly Bonded Wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 863
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- 1995
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Direct Wafer Bonding of Preamorphized Silicon Wafers.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 869
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- 1995
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Thick oxide MOS transistors for ionizing radiation dose measurement
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- Journal:
- Radioprotection / Volume 29 / Issue 4 / October 1994
- Published online by Cambridge University Press:
- 12 May 2009, pp. 557-572
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- October 1994
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Analysis of the HF-Etihanol Cleaning Process on Silicon Wafers with 100 Vicinal Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 315 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 473
- Print publication:
- 1993
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M.O.S. Transistors with > 1 μm Thick Gate Oxide for Ionizing Radiation Dosimetry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 302 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 555
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- 1993
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Poly-Si Thin Film Transistors Fabricated with Rapid Thermal Processing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 303 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 389
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- 1993
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HF/Ethanol Preoxidation Silicon Cleaning: Analysis of the Silicon Surface and of the Ultra-Thin Oxide Layer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 259 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 119
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- 1992
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Apid Thermal Oxidation of Silicon: Aspects of the Initial Regime Kinetics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 204 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 351
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- 1990
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