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51 results

Page 1 of 3

  • Remote Operation: The Future of Education and Research in Electron Microscopy
  • Daniel E. Huber, Frank J. Scheltens, Robert E.A. Williams, David W. McComb
  • Journal: Microscopy Today / Volume 26 / Issue 5 / September 2018
  • Published online by Cambridge University Press: 11 September 2018, pp. 26-33
  • Print publication: September 2018
  • View abstract

    The OSU-FEI Electron Microscopy Collaboratory multiplies the number of individuals who can experience hands-on advanced microscopy techniques. The microscopy classroom allows up to 33 attendees to operate, individually and in real time, electron microscopes as if they were sitting in front of the actual instruments. The communications link, a fast backbone augmented by Internet2, allows various microscopes to be operated from the classroom or by collaborators in another city. This system transforms the training of new users from a one-person-at-a-time session with an expert operator to a group collaborative activity that can include users from around the world.

  • Nano-Cathodoluminescence Measurement of Asymmetric Carrier Trapping and Radiative Recombination in GaN and InGaN Quantum Disks
  • Julia I. Deitz, A. T. M. Golam Sarwar, Santino D. Carnevale, Tyler J. Grassman, Roberto C. Myers, David W. McComb
  • Journal: Microscopy and Microanalysis / Volume 24 / Issue 2 / April 2018
  • Published online by Cambridge University Press: 27 April 2018, pp. 93-98
  • Print publication: April 2018
  • View abstract

    The ability to characterize recombination and carrier trapping processes in group-III nitride-based nanowires is vital to further improvements in their overall efficiencies. While advances in scanning transmission electron microscope (STEM)-based cathodoluminescence (CL) have offered some insight into nanowire behavior, inconsistencies in nanowire emission along with CL detector limitations have resulted in the incomplete understanding in nanowire emission processes. Here, two nanowire heterostructures were explored with STEM-CL: a polarization-graded AlGaN nanowire light-emitting diode (LED) with a GaN quantum disk and a polarization-graded AlGaN nanowire with three different InGaN quantum disks. Most nanowires explored in this study did not emit. For the wires that did emit in both structures, they exhibited asymmetrical emission consistent with the polarization-induced electric fields in the barrier regions of the nano-LEDs. In the AlGaN/InGaN sample, two of the quantum disks exhibited no emission potentially due to the three-dimensional landscape of the sample or due to limitations in the CL detection.

  • Measuring optical properties of individual SnO2 nanowires via valence electron energy-loss spectroscopy
  • Derek R. Miller, Robert E. Williams, Sheikh A. Akbar, Pat A. Morris, David W. McComb
  • Journal: Journal of Materials Research / Volume 32 / Issue 13 / 14 July 2017
  • Published online by Cambridge University Press: 15 May 2017, pp. 2479-2486
  • Print publication: 14 July 2017
  • View abstract

    For the first time, valence electron energy-loss spectroscopy (VEELS) was applied to individual single-crystalline SnO2 nanowires to investigate the dielectric function, band gap, and optical absorption coefficient. The results are compared with data from optical techniques such as spectroscopic ellipsometry and UV-Vis, and theoretical calculations from variations of density functional theory. The data obtained agree well with the standard optical and theoretical techniques. The dielectric function and optical absorption coefficient are given up to 20 eV, which otherwise requires a synchrotron source and large single crystals via optical methods. The energy loss function is given up to 40 eV, which gives a useful comparison to previous theoretical studies in an energy range that cannot be achieved via optical measurements. The comparison gives confidence in the accuracy of this method for exploring spatially-resolved measurements in individual nanoparticles or more complex nanostructures that are otherwise difficult to measure accurately using optical techniques.

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