Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-18T00:19:53.430Z Has data issue: false hasContentIssue false
  • English
  • Français

An Electron Microscopy Collaboratory for Correlative Imaging Sciences

Published online by Cambridge University Press:  05 August 2019

Daniel E. Huber ,
Frank J. Scheltens ,
Robert E.A. Williams ,
David B. Williams  and
David W. McComb
Daniel E. Huber
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA.
Frank J. Scheltens
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA.
Robert E.A. Williams
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA.
David B. Williams
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA. Dept. Materials Science and Engineering, The Ohio State University, Columbus, OH, USA.
David W. McComb*
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA. Dept. Materials Science and Engineering, The Ohio State University, Columbus, OH, USA.
*
*Corresponding author: mccomb.29@osu.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2294 - 2295
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zaluzec, NJ, Teleconference Mag. 17 (1998).Google Scholar
[2]Fan, GY et al. , Ultramicroscopy 52 (1993), p. 499.Google Scholar
[3]Furuya, K et al. , Microscopy & Microanalysis 11 (2005), p. 68.Google Scholar
[4]Brown, GM et al. , Microcopy & Microanalysis 15 (2009), p. 1102.Google Scholar
[5]Mansfield, JF et al. , Microscopy & Microanalysis 6 (2000), p. 31.Google Scholar
[6]Mansfield, JF, Microscopy & Microanalysis 14 (2008), p. 876.Google Scholar
[7]Isabell, TC et al. , Microscopy & Microanalysis 14 (2008), p. 872.Google Scholar
[8]Huber, DA et al. , Microscopy Today (2018), p. 28.Google Scholar
[9]The authors acknowledge support from ThermoFisherScientific, the Air Force Research Laboratory (AFRL) and NSF (Award Number: 0812348 “Remote Microscopy Station to Provide Direct Access to Image and Probe-Corrected Transmission Electron Microscopes for Transformative Atomically-Resolved Analysis of Structural and Functional Materials for Future Materials Innovation and Manufacturing”) to create the remote operation system at North Carolina Agricultural and Technical UniversityGoogle Scholar