6 results
The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2394-2395
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
In-situ observations of recrystallization in CuInSe2 solar cells via STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1492-1493
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 6 / December 2015
- Published online by Cambridge University Press:
- 14 September 2015, pp. 1644-1648
- Print publication:
- December 2015
-
- Article
- Export citation
Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications
-
- Journal:
- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 18-24
- Print publication:
- May 2012
-
- Article
-
- You have access
- HTML
- Export citation
Preferred Orientation, Grain Sizes and Grain Boundaries of Chalcopyrite-Type Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1012 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1012-Y09-03
- Print publication:
- 2007
-
- Article
- Export citation
Dependence of the MoSe2 Formation on the Mo Orientation and the Na Concentration for Cu(In,Ga)Se2 Thin-Film Solar Cells
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 865 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, F8.1
- Print publication:
- 2005
-
- Article
- Export citation