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The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity

Published online by Cambridge University Press:  05 August 2019

Pat Trimby*
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK.
Angus Bewick
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK.
Daniel Abou-Ras
Affiliation:
Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, Germany.
Pietro Caprioglio
Affiliation:
Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany.
Dieter Neher
Affiliation:
Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany.
Laura Otter
Affiliation:
Department of Earth & Planetary Science, Macquarie University, Sydney, Australia.
*
*Corresponding author: pat.trimby@oxinst.com
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Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jeon, NJ et al. , Nature 517 (2015), p. 476.CrossRefGoogle Scholar
[2]Otter, L et al. , Biogeosciences (2019). https://doi.org/10.5194/bg-2018-469Google Scholar
[3]Abbasi, K et al. , Microscopy & Microanalysis 24 (2018), p. 420.CrossRefGoogle Scholar
[4]Jiang, C and Zhang, P, J. Appl. Phys 123 (2018), p. 083105.CrossRefGoogle Scholar
[5]US Patent US8890065B2: Apparatus and method for performing microdiffraction analysis.Google Scholar
[6]Vespucci, S et al. , Physical Review B 92 (2015), p. 205301.CrossRefGoogle Scholar
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