17 results
Comparison of Cliff–Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 3 / June 2018
- Published online by Cambridge University Press:
- 31 May 2018, pp. 193-206
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- June 2018
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Oxygen X-Ray Maps: Comparing a Vintage WDS System with a Modern SDD System
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- Microscopy Today / Volume 24 / Issue 5 / September 2016
- Published online by Cambridge University Press:
- 09 September 2016, pp. 34-37
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- September 2016
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Quantitative X-Ray Microanalysis of Thin NiO Films by Monte Carlo and Cliff-Lorimer Methods
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- Microscopy Today / Volume 22 / Issue 2 / March 2014
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- 11 March 2014, pp. 28-35
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- March 2014
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FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient
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- Microscopy and Microanalysis / Volume 19 / Issue 1 / February 2013
- Published online by Cambridge University Press:
- 03 January 2013, pp. 79-84
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- February 2013
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X-Ray Microanalysis Combined with Monte Carlo Simulation for the Analysis of Layered Thin Films: The Case of Carbon Contamination
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- Microscopy and Microanalysis / Volume 15 / Issue 2 / April 2009
- Published online by Cambridge University Press:
- 16 March 2009, pp. 99-105
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- April 2009
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Quantitative Thin-Film X-ray Microanalysis by STEM/HAADF: Statistical Analysis for Precision and Accuracy Determination
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- Microscopy and Microanalysis / Volume 12 / Issue 4 / August 2006
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- 14 July 2006, pp. 318-321
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- August 2006
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Strain mapping in deep sub-micron Si devices by convergent beam electron diffraction in the STEM
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- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
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- 15 July 2004, pp. 49-54
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- July 2004
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Strain Field Distribution in Submicron Devices by TEM/CBED. A European Project
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1076-1077
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- August 2000
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Sol-gel processing of nanocrystalline haematite thin films
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- Journal of Materials Research / Volume 12 / Issue 6 / June 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1441-1444
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- June 1997
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Transmission Electron Diffraction Techniques for Nm Scale Strain Measurement in Semiconductors
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- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 435
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- 1995
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Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors
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- MRS Online Proceedings Library Archive / Volume 406 / 1995
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- 15 February 2011, 479
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- 1995
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Determination of Bulk Mismatch Values in Heterostructures” by TEM/CBED
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- MRS Online Proceedings Library Archive / Volume 405 / 1995
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- 15 February 2011, 467
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- 1995
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Boron and antimony codiffusion in silicon
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- Journal of Materials Research / Volume 6 / Issue 11 / November 1991
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- 31 January 2011, pp. 2353-2361
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- November 1991
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Electron microscopy characterization of monoclinic SiAs precipitates in heavily As+-implanted silicon
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- Journal of Materials Research / Volume 6 / Issue 8 / August 1991
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1701-1710
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- August 1991
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As and B Ion Implantation Through Mo and into Mo-Silicide Layers for Shallow Junction Formation
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- MRS Online Proceedings Library Archive / Volume 157 / 1989
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- 25 February 2011, 751
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- 1989
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Electrical Characterization of Ion Imiplanted, Thermally Annealed TiN Films Acting as Diffusion Barriers on Shallow Junction Silicon Devices
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- MRS Online Proceedings Library Archive / Volume 45 / 1985
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- 25 February 2011, 183
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- 1985
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Characterization of Al-Si Ohmic Contacts Obtained on Shallow Junctions by Laser and Electron Beam Annealing
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- MRS Online Proceedings Library Archive / Volume 1 / 1980
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- 15 February 2011, 329
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- 1980
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