6 results
Characterization of Defects in III-V Semiconductor Materials (InP, GaAs and InGaAs/ InP on Si) in Nano-sized Patterns by Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1540-1541
- Print publication:
- July 2016
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Induced moulting issues and alternative dietary strategies for the egg industry in the United States
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- Journal:
- World's Poultry Science Journal / Volume 60 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 18 September 2007, pp. 196-209
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- June 2004
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Low Temperature Polycrystalline Si TFTs Fabricated with Directionally Crystallized Si Film
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- Journal:
- MRS Online Proceedings Library Archive / Volume 621 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, Q8.3.1
- Print publication:
- 2000
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The Dependence of Poly-Si TFT Characteristics on the Relative Misorientation Between Grain Boundaries and the Active Channel
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- Journal:
- MRS Online Proceedings Library Archive / Volume 621 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, Q9.14.1
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- 2000
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The Optical and Crystalline Structure Properties of ZnO Thin Films Grown by Rf Magnetron Sputtering
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- Journal:
- MRS Online Proceedings Library Archive / Volume 560 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 119
- Print publication:
- 1999
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Rapid Thermal Annealing of GaAs Films on (001) Si Substrate Grown by Solid Phase Epitaxy Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 202 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 473
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- 1990
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