6 results
Estimation of polarization mode dispersion and polarization dependent loss in a cascade of optical components
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- Journal:
- The European Physical Journal - Applied Physics / Volume 44 / Issue 2 / November 2008
- Published online by Cambridge University Press:
- 19 September 2008, pp. 155-161
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- November 2008
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Critical dimension of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry
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- Journal:
- The European Physical Journal - Applied Physics / Volume 42 / Issue 3 / June 2008
- Published online by Cambridge University Press:
- 04 June 2008, pp. 351-359
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- June 2008
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Comparative study of atomic force mode and tunneling mode tip-enhanced Raman spectroscopy
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- Journal:
- The European Physical Journal - Applied Physics / Volume 40 / Issue 2 / November 2007
- Published online by Cambridge University Press:
- 31 October 2007, pp. 197-201
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- November 2007
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Tip-Enhanced Raman Micro Spectroscopy and Imaging on Commercially Available AFM's and Raman Microscopes
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 650-651
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- August 2006
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Metrological applications of Mueller polarimetry in conical diffraction for overlay characterization in microelectronics
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- Journal:
- The European Physical Journal - Applied Physics / Volume 31 / Issue 1 / July 2005
- Published online by Cambridge University Press:
- 27 April 2005, pp. 63-69
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- July 2005
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In Situ Investigation of Amorphous Silicon / Silicon Nitride Interfaces by Infrared Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 284 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 425
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- 1992
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