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Comparative study of atomic force mode and tunneling mode tip-enhanced Raman spectroscopy

Published online by Cambridge University Press:  31 October 2007

G. Picardi ,
Q. Nguyen ,
J. Schreiber  and
R. Ossikovski
G. Picardi*
Affiliation:
LPICM, École Polytechnique, CNRS, 91128 Palaiseau, France
Q. Nguyen
Affiliation:
LPICM, École Polytechnique, CNRS, 91128 Palaiseau, France
J. Schreiber
Affiliation:
HORIBA Jobin Yvon SAS, Raman Division, 231 rue de Lille, 59650 Villeneuve d'Ascq, France
R. Ossikovski
Affiliation:
LPICM, École Polytechnique, CNRS, 91128 Palaiseau, France
*
gennaro.picardi@polytechnique.edu

Abstract

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In Tip-Enhanced Raman Spectroscopy (TERS) a metal (or metallized) sharp tip is used to enhance the electromagnetic field by a localized surface-plasmon excitation. Two different modes – atomic force mode (AFM) and scanning tunneling mode (STM) – together with their respective types of probe tips are used in TERS experiments. We have compared the efficiency in enhancing the Raman signal on a thin dye layer for metal-coated AFM tips as well as for electrochemically etched metal STM tips. A much higher enhancement factor and better reproducibility were found when using STM tips. The very different performance is mainly attributed to the more efficient plasmonic excitation when using bulk-metal tips and possibly to the morphological differences in the tip and apex shapes existing between the two tip types.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 40 , Issue 2 , November 2007 , pp. 197 - 201
Copyright
© EDP Sciences, 2007

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