15 results
Basic Questions Related to Electron-Induced Sputtering
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1356-1357
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- July 2009
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3D Imaging of Si and Er Nanoclusters in Er Doped SiO1.5 Films by STEM Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1256-1257
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- July 2009
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TEM Studies of Au/Si Epilayer Interfaces
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1450-1451
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- July 2009
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Synthesis and Interfacial Characterization of Au Nanoparticles on Si Nanowires
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 302-303
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- August 2008
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Use of Fourier-ratio deconvolution for processing low-loss EELS spectra
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1412-1413
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- August 2008
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Spatial resolution and delocalization of the EELS core-loss fine structure
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1344-1345
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- August 2008
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Oxidation Mapping by Postpeak Technique
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1304-1305
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- August 2007
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Parallel Beam Nano-Diffraction Analysis of Individual Nanoparticles
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 558-559
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- August 2007
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Property Map by Electron Spectroscopy Imaging Series
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1158-1159
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- August 2006
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Quantitative Dose-damage Relationships for Radiation Damage to Polymers and Molecular Compounds in X-ray and Electron Microscopes
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 2046-2047
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- August 2005
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Cs Corrected Bright Field Imaging of Radiation Sensitive Materials
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 2150-2151
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- August 2005
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Erosion of TEM Specimens in an Intense Electron Beam
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 54-55
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- August 2004
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Determining Concentration Limits for Boron Quantification Using EELS and for Energy-Filtered Imaging
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 164-165
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- August 2000
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Gas-phase nucleation during chemical vapor deposition of copper films and its effect on the resistivity of deposited films
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- Journal of Materials Research / Volume 14 / Issue 11 / November 1999
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- 31 January 2011, pp. 4345-4350
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- November 1999
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Calibration Specimens for Determining Energy-Dispersive X-ray k-Factors of Boron, Nitrogen, Oxygen, and Fluorine
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- Microscopy and Microanalysis / Volume 5 / Issue 1 / January 1999
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- 31 July 2002, pp. 29-38
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- January 1999
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