Hostname: page-component-848d4c4894-2xdlg Total loading time: 0 Render date: 2024-06-21T03:36:24.962Z Has data issue: false hasContentIssue false
  • English
  • Français

Determining Concentration Limits for Boron Quantification Using EELS and for Energy-Filtered Imaging

Published online by Cambridge University Press:  02 July 2020

M. Malac ,
Y. Zhu  and
R. F. Egerton
M. Malac
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, NY, 11973USA Department of Physics, University of Alberta, Edmonton, T6G 2J1Canada
Y. Zhu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, NY, 11973USA
R. F. Egerton
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, NY, 11973USA Physics Department, Portland State University, Oregon97207-0751, USA
Get access

Extract

Electron energy-loss spectrometry and energy-filtered imaging allow the possibility of detecting, quantifying and mapping of boron. Boron spatial distribution in biological tissue is of particular interest for boron neutron capture therapy (BNCT) for cancer. We have studied the limits of boron quantification and mapping using electron energy-loss spectroscopy and energy-filtered imaging.

To evaluate the concentration limits for boron mapping and quantification three types of specimens were used. First, a uniform boron layer of well known thickness deposited onto of 50 nm-thick carbon film was used to determine the limits for boron quantification. Second, samples for boron mapping with non-uniform boron distribution were prepared by electron-beam evaporation of boron onto a shadow-masked 50 nm-thick carbon film. Third, tobacco mosaic virus (TMV) in a water solution of boronophenylalanine fructrose (BPA-F) was deposited onto a 2 nm—thick carbon film.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 164 - 165
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Zhu, Y., Egerton, R.F., and Malac, M., submitted to Ultramicroscopy.Google Scholar
2.Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope, Plenum 1996.CrossRefGoogle Scholar
3.Egerton, R.F., Journal of Electron Microscopy 48 (1999), p.711.CrossRefGoogle Scholar
4. Work at BNL was supported by U.S. Department of Energy, under contract No. DE-AC02-98CH10886, and at U of A by the Natural Sciences and Engineering Research Council of CanadaGoogle Scholar